Z-Tec ZT4211, User Manual

Page: 42 / 59

42 0004-000067
Process Variable Type Values Description
UtilSelfTest
mbbiDire
ct 0000
16
to
0375
16
Initiates an instrument self test and returns the test
results as a 16-bit code. The self test is initiated on
instrument power up.
Bit 0 = baseboard test failed
Bit 1 = unused
Bit 2 = ROM test failed
Bit 3 = unused
Bit 4 = reference oscillator test failed
Bit 5 = SDRAM test failed
Bit 6 = flash memory test failed
Bit 7 = unused
Bit 8 = digitizer submodule 1 test failed
Bit 9 = digitizer submodule 2 test failed
(ZT4xx2)
Bit 10 -15 = unused
UtilTestCountBB longin integer Returns the number of failure reports from last
baseboard self test. 0 to 9 failures.
Note:
This functionality is only valid for the ZT44xx
UtilTestCountSM1 longin integer Returns the number of failure reports from last
baseboard self test. 0 to 9 failures.
Note:
This functionality is only valid for the ZT44xx
UtilTestCountSM2 longin integer ZT4xx2 Only. Returns the number of failure reports
from last submodule2 self test. 0 to 19 (ZT4610),
13(ZT4400), 10(ZT4210) failures.
Note:
This functionality is only valid for the ZT44xx
UtilTestReportBB stringin string Returns last baseboard command that caused a
failure.
Note:
This functionality is only valid for the ZT44xx
UtilTestReportSM1 stringin string Returns last submodule1 command that caused a
failure.
Note:
This functionality is only valid for the ZT44xx
UtilTestReportSM2 stringin string ZT4xx2 Only. Returns last submodule2 command
that caused a failure.
Note:
This functionality is only valid for the ZT44xx
UtilLockState bi 0 or 1 Queries the instrument’s lock state.
0 = unlocked, full control available through
EPICS interface
1 = locked, EPICS interface is read-only