Document MT0605P.E
© Xsens Technologies B.V.
MTi User Manual
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4.7 Built-in self-test
All MTi’s feature a built-in self-test (BIT). The self-test actuates the mechanical structures in the MEMS
accelerometer and gyroscope by inducing an electric signal. This allows checking the proper
functioning of the mechanical structures in the MEMS inertial sensors as well as the signal processing
circuitry. In the magnetometer, a magnetic field is induced by a coil designed around the component,
which will generate an offset in the signal.
During self-test the MTi will read out all sensors and in case of a successful self-test, a known offset
with respect to the signal prior to enabling self-test should be visible in the data. The MTi will internally
evaluate the sensors readings, the self-test will return the status of the self-test per individual sensor.
The status is stored into the non-volatile memory.
A passed self-test will result in a valid self-test flag in the status byte. Because the self-test influences
the sensor data, the self-test is only available in Config mode. For more information, refer to [LLCP],
function
RunSelftest
.
