WAGO-I/O-SYSTEM 750
Device Description 25
750-450 4 AI RTD
Manual
Version 1.2.0
Table 16: Technical Data – Measuring Accuracy at 25°C Ambient Air Temperature, 3 Wires
Pt100 (IEC 751)*
−200 °C… 850 °C
≤ ±0.6 K
−50 °C … 150 °C
≤ ±0,6 K
Pt200 (IEC 751)
−200 °C … 850 °C
≤ ±0.5 K
Pt500 (IEC 751)
−200 °C … 850 °C
≤ ±0.5 K
Pt1000 (IEC 751)
−200 °C … 850 °C
≤ ±0.2 K
−50 °C … 150 °C
≤ ±0.2 K
Ni100 (DIN 43760)
−60 °C … 250 °C
≤ ±0.4 K
Ni120 (Minco)
−80 °C … 260 °C
≤ ±0.3 K
Ni1000 (TK5000 (Landis & Staefa)) −60 °C … 250 °C
≤ ±0.2 K
−50 °C … 150 °C
≤ ±0.2 K
Ni1000 (TK6180, DIN 43760),
−60 °C … 250 °C
≤ ±0.2 K
−50 °C … 150 °C
≤ ±0.2 K
Potentiometer
0 % … 100 %
≤ ±0.1 %
Resistance measurement 1
0 Ω … 5000 Ω
≤ ±0.7 Ω
Resistance measurement 2
0 Ω … 1200 Ω
≤ ±0.7 Ω
* Default
Table 17: Technical Data – Measuring Accuracy at 25°C Ambient Air Temperature, 4 Wires
Pt100 (IEC 751)*
−200 °C… 850 °C
≤ ±0.6 K
−50 °C … 150 °C
≤ ±0,6 K
Pt200 (IEC 751)
−200 °C … 850 °C
≤ ±0.5 K
Pt500 (IEC 751)
−200 °C … 850 °C
≤ ±0.3 K
Pt1000 (IEC 751)
−200 °C … 850 °C
≤ ±0.2 K
−50 °C … 150 °C
≤ ±0.2 K
Ni100 (DIN 43760)
−60 °C … 250 °C
≤ ±0.3 K
Ni120 (Minco)
−80 °C … 260 °C
≤ ±0.3 K
Ni1000 (TK5000 (Landis & Staefa)) −60 °C … 250 °C
≤ ±0.2 K
−50 °C … 150 °C
≤ ±0.2 K
Ni1000 (TK6180, DIN 43760),
−60 °C … 250 °C
≤ ±0.2 K
−50 °C … 150 °C
≤ ±0.2 K
Resistance measurement 1
0 Ω … 5000 Ω
≤ ±0.3 Ω
Resistance measurement 2
0 Ω … 1200 Ω
≤ ±0.3 Ω
* Default