Veeco 004-210-000, Instruction Manual

Page: 107 / 358

Rev. B MultiMode SPM Instruction Manual 87
Chapter 6 Contact AFM Mode
This chapter covers procedures for operating the MultiMode SPM in Contact AFM Mode. It is
assumed the operator has previously prepared a Contact Mode probe and aligned the MultiMode
head per instructions provided in
Chapter 5 of this manual. Speci fi c information regarding tip
preparation is provided in Chapter 6 ; Appendix A of the Command Reference Manual contains
further information regarding tips.
The following sections are included in this chapter:
•
Preparation Prior to Imaging: Section 6.1
•
Adjust the Detector Offsets: Section 6.1.1
•
Signal Settings: Section 6.1.2
•
Adjust tip height above sample surface: Section 6.1.3
•
Position Tip with OMV: Section 6.1.4
•
Suggested Initial Control Settings: Section 6.2
•
Show All Items: Section 6.2.1
•
Initial Scan Parameter Settings: Section 6.2.2
•
Initiate the Engage Command: Section 6.3
•
Adjust Setpoint with Force Calibration: Section 6.3.1
•
Adjust Sensitivity (if required): Section 6.3.2
•
Beyond the Basics of AFM Operation: Section 6.4
•
Cantilever Selection: Section 6.4.1
•
Optimization of Scanning Parameters: Section 6.5
•
Data type: Section 6.5.1
•
Gain settings: Section 6.5.2