Contact AFM Mode
Beyond the Basics of AFM Operation
98
MultiMode SPM Instruction Manual
Rev. B
6.3.2 Adjust Sensitivity (if required)
If imaging in
De
fl
ection
mode instead of
Height
mode, adjust the detector’s
Sensitivity
parameter
to the cantilever as described in this section. Use the mouse to draw a line parallel to the part of the
plot where the tip is on the surface. To clear the screen, click the mouse’s right button while in the
graph.
6.4
Beyond the Basics of AFM Operation
The above section provided a quick introduction to setup of the MultiMode microscope in the
Contact AFM Mode. Although a great deal can be accomplished from this starting point, there is far
more to the operation of the AFM. More regarding tip-sample interactions can be learned in
Chapter 2 of the
NanoScope Software 6.11 User Guide
Force Calibration (Contact Mode AFM):
in this instructional manual contains valuable information regarding the precise
measurement of tip-sample forces.
Cantilever selection is an important area and it will become more important as tip and cantilever
technology continues to develop. A clear understanding of the parameters in the
Realtime
control
panel allows the user to tune the microscope to a wide variety of samples. Force mode imaging
provides a great deal of information if the user fully understands its nuances. For more information
regarding force mode imaging, see
6.4.1 Cantilever Selection
Two basic cantilever con
fi
gurations are available for the Contact AFM Mode. Traditional triangular
silicon nitride cantilevers have been used successfully for years. They are robust and relatively
inexpensive. Etched silicon cantilevers with integral tips provide another scanning option. They
have a higher aspect ratio and a smaller radius of curvature than the silicon nitride cantilevers.
Silicon nitride cantilevers for this system are available in two process variations: standard and
sharpened. Usually, the standard silicon nitride cantilevers and resonant mode etched silicon probes
are shipped with the MultiMode. Sharpened silicon nitride cantilevers have an almost identical
appearance, but have slightly sharper tips. Note that this system does not require the “stand-alone”
Click and drag line parallel to sloped portion of plot.
