NOVA AND NOVA PRO
Measurements
27
5.3.7.
Trip-out time
Trip-out time measurement is used to verify the effectiveness of an RCD. This is achieved by a
test simulating an appropriate fault condition. Trip-out times vary between standards and are
listed below.
Trip-out times according to BS EN 61008 / BS EN 61009:
½
I
*)
Δ
N
I
Δ
N
2
I
Δ
N
5
I
Δ
N
General (non-
delayed) RCDs
t
Δ
> 300 ms
t
Δ
< 300 ms
t
Δ
< 150 ms
t
Δ
< 40 ms
Selective (time-
delayed) RCDs
t
Δ
> 500 ms
130 ms < t
Δ
<
500 ms
60 ms < t
Δ
<
200 ms
50 ms < t
Δ
<
150 ms
Trip-out times according to BS 7671:
½
I
*)
Δ
N
I
Δ
N
2
I
Δ
N
5
I
Δ
N
General (non-
delayed) RCDs
t
Δ
> 1999 ms
t
Δ
< 300 ms
t
Δ
< 150 ms
t
Δ
< 40 ms
Selective (time-
delayed) RCDs
t
Δ
> 1999 ms
130 ms < t
Δ
<
500 ms
60 ms < t
Δ
<
200 ms
50 ms < t
Δ
<
150 ms
*)
Test current of ½
I
ΔN
cannot cause trip-out of the RCDs.
How to perform trip-out time measurement
Step 1
Select the
RCD
function FCT key and select the
Time
mode with the
▲▼
and
◀▶navigation
keys. The following menu will be displayed:
Figure 5-15: Trip-out time measurement menu
Step 2
Set the following measuring parameters:
•
I
ΔN
: Nominal differential trip-out current,
•
Factor:
Nominal differential trip-out current multiplier,
•
Type:
RCD type and
•
Pol.:
Test current starting polarity.
