Connections Descriptions
7
SLVUBD4A – January 2018 – Revised December 2018
Copyright © 2018, Texas Instruments Incorporated
High Side Switch Motherboard Evaluation Module
3
Connections Descriptions
3.1
Connectors and Test Points
lists the EVM connector and test point descriptions.
Table 1. Connector and Test Point Descriptions
Connectors and Test Points
Descriptions
J23
High-current input terminal for VBB
J26
High-current output for VOUT1
J27
High-current output for VOUT2
J28
High-current output for paralleling 2 channels into single channel VOUT
J25
High-current input terminal for GND
Vbb_Sense (TP11)
Test point used to measure VBB Votlage
Vout1_Sense (TP10)
Test point to measure VOUT1 Voltage
Vout2_Sense (TP12)
Test point to measure VOUT2 Voltage
EN1 (TP3)
Test point used to apply power to EN1, only use when J9 is not connected to 5V or GND
EN2 (TP7)
Test point used to apply power to EN2, only use when J13 is not connected to 5V or GND.
Only for 2 channel devices.
DIA_EN (TP4)
Test point used to apply power to DIA_EN, only use when J10 is not connected to 5 V or
GND
SEL1 (TP5)
Test point used to apply power to SEL1, only use when J12 is not connected to 5 V or GND
SEL2 (TP6)
Test point used to apply power to SEL2, only use when J11 is not connected to 5 V or GND
LATCH (TP2)
Test point used to apply power to LATCH, only use when J8 is not connected to 5 V or GND
SNS (TP1)
Test point used to measure SNS
TP17
Connects to ISNS1 on the daughtercard
TP18
Connects to ISNS2 on the daughtercard. Only for 2 channel devices.
TP8
5-V external input terminal for 5-V EVM
TP13, TP14, TP15, TP16
This is a direct connection to the GND plane of the EVM
