DC Source
VIN
V1
V2
Vin
J303
GND
GNDS
TP305
V3
Electronic
Load
TP304
DC Source
V5IN
A2
J301
TP303
5V
TP301
GND
TP302
TP306
TP307, TP310, TP311
GND
J304
Vouts
TP308
GNDS
TP309
Vout
EN(J302)
Vins
Test Setup
4.2
Recommended Test Setup
Figure 3. CSD87588NEVM-603 Recommended Test Setup
shows the recommended test setup to evaluate the CSD87588NEVM-603. Working at an ESD
workstation, make sure that any wrist straps, bootstraps, or mats are connected. Reference the user-to-
earth ground before power is applied to the EVM.
Input Connections:
1. Prior to connecting the DC source VIN, TI recommends to limit the source current from VIN to 10-A
maximum. Ensure that VIN is initially set to 0 V and connected (as shown in
2. Prior to connecting the DC source V5VIN, TI recommends to limit the source current from 5V to 0.5-A
maximum. Ensure that V5VIN is initially set to 0 V and connected (as shown in
).
3. Connect a voltmeter, V1, at TP304 (Vins) and TP305 (GNDS) to measure VIN voltage, V2 at TP301
(5V), and TP302 (GND) to measure 5V voltage (as shown in
4. Connect a current meter A1 between DC source VIN and J303 to measure the input current.
5. Connect a current meter A2 between DC source V5VIN and J301 to measure the 5V input current.
Output Connections:
1. Connect the load to J304 and set load to constant resistance mode to sink 0-ADC before VIN and
V5VIN are applied.
2. Connect a voltmeter V3 at TP308 (VOUTS) and TP309 (GNDS) to measure the output voltage.
5
SLPU002A – February 2014 – Revised February 2014
High Power Density, Low Profile NexFET™ Power Block II for Notebook
Power Supply
Copyright © 2014, Texas Instruments Incorporated