Digital Compare
Signals
Counter Compare
Signals
Time Base
Signals
Dead
Band
(DB)
Counter
Compare
(CC)
Action
Qualifier
(AQ)
ePWMxA
ePWMxB
CTR = 0
EPWMxINT
EPWMxSOCA
EPWMxSOCB
Time-Base
(TB)
CTR = PRD
CTR = 0
CTR_Dir
EPWMxSYNCI
EPWMxSYNCO
EPWMxTZINT
PWM-
chopper
(PC)
Event
Trigger
and
Interrupt
(ET)
ADC
PIE
PIE
Digital Compare
Signals
Digital Compare
Signals
CTR = CMPB
CTR = CMPA
CTR = CMPC
CTR = CMPD
CTR = PRD
Trip
Zone
(TZ)
ePWMxA
ePWMxB
TZ1 to TZ3
GPIO
MUX
Digital
Compare
(DC)
EMUSTOP
CLOCKFAIL
EQEPxERR
GPTRIP
CPU
SYSCTRL
EQEPx
COMPxOUT
GPTRIP
PIEERR
ECCDBLERR
TZ1
TZ3
to
GPIO
MUX
28x RAM/
Flash ECC
ePWM Submodules
724
SPRUHE8E – October 2012 – Revised November 2019
Copyright © 2012–2019, Texas Instruments Incorporated
C28 Enhanced Pulse Width Modulator (ePWM) Module
7.2.7 Trip-Zone (TZ) Submodule
shows how the trip-zone (TZ) submodule fits within the ePWM module.
Figure 7-38. Trip-Zone Submodule
Each ePWM module is connected to six TZn signals (TZ1 to TZ6). TZ1 to TZ3 are sourced from the GPIO
mux. TZ4 is sourced from an inverted EQEPxERR signal on those devices with an EQEP module. TZ5 is
connected to the system clock fail logic, and TZ6 is sourced from the EMUSTOP output from the CPU.
These signals indicate external fault or trip conditions, and the ePWM outputs can be programmed to
respond accordingly when faults occur.
7.2.7.1
Purpose of the Trip-Zone Submodule
The key functions of the Trip-Zone submodule are:
•
Trip inputs TZ1 to TZ6 can be flexibly mapped to any ePWM module.
•
Upon a fault condition, outputs EPWMxA and EPWMxB can be forced to one of the following:
–
High
–
Low
–
High-impedance
–
No action taken
•
Support for one-shot trip (OSHT) for major short circuits or over-current conditions.
•
Support for cycle-by-cycle tripping (CBC) for current limiting operation.
•
Support for digital compare tripping (DC) based on state of on-chip analog comparator module outputs
and/or TZ1 to TZ3 signals.
•
Each trip-zone input and digital compare (DC) submodule DCAEVT1/2 or DCBEVT1/2 force event can
be allocated to either one-shot or cycle-by-cycle operation.
•
Interrupt generation is possible on any trip-zone input.
•
Software-forced tripping is also supported.
•
The trip-zone submodule can be fully bypassed if it is not required.