TEST AFE5809
The ADC must be set to the proper configuration for Demodulation:
•
ADC format must be MSB First, 2's Complement
•
LVDS Rate must be set to 16X
•
Choose any demodulator test mode from the following buttons: Sine Test Mode, RF Test Mode,
Coefficient Test Mode and Demod M=4 I/Q Test Mode.
•
For modes and options, load a text using "Exec CMD File".
Figure 12. Demod Quick Load Buttons
Next, capture triggered data from the TSW capture card:
•
Change TSW1400 GUI Firmware setting to "AFE5808_09_16b"
•
Enable Trigger Mode in TSW GUI
•
Capture data by pressing the Read DDR Memory button. (In triggered mode, press this button twice to
capture updated data). The output on the plot does not make any sense because of the LSB and MSB
disconnect between the AFE5809 GUI and the TSW GUI. Also, if the trigger is not strong enough to
drive a 50-
Ω
load, the R83 may need to be removed from the AFE EVM.
Next, import the TSW data into the AFE5809GUI for data processing:
•
Go back to the AFE GUI and choose under the Demodulator main tab, choose "Demodulator Plot".
This should be set-up for M=4, Channel 1, MSB mode, Record size should be 2000. If a capture has
taken place in the TSW GUI, then click "TSW capture" on the Demodulator Plot Tab and the Raw Data
Plot updates with the data from the TSW memory. If the "MSB" button is true, then the raw data should
make sense. Note: Do not choose "2's complement" in Sine Test Mode.
•
Try this process (TSW GUI Capture twice -> AFE GUI "TSW Capture") for the other test modes.
•
Under RF Test Mode, the output should look similar to the input.
13
SLOU338A – October 2012 – Revised November 2012
AFE5809EVM Evaluation Module
Copyright © 2012, Texas Instruments Incorporated