Tektronix P7313SMA, Technical Reference

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Performance Veri fi cation
Rise Time
This procedure veri fi es that the probe meets the differential rise time speci fi cation. Two rise times are measured; the test
system alone, and the test system with the probe included. The probe rise time is calculated using the two measurements.
Note: This test uses the TDR function of the 80E08 or 80E10 sampling head as a fast rise time signal source. A second
80E0X sampling head is used to take the measurements, using an 80A03 TekConnect probe interface. Although the
following procedure assigns the TDR and measurement functions to speci
fi c oscilloscope channels, any valid channel
combination can be used. However, the TDR rise times required of the sampling heads in this test are only available on
80E08 and 80E10 sampling heads.
This test checks both of the probe attenuation settings, but due to the differential TDR output amplitude and common mode
voltage, inline 5X attenuators must be used when checking the 2.5X attenuation setting on the probe.
Rise Time Check at 12.5X Attenuation
1. Connect the test equipment as shown. (See Figure 29.)
CAUTION. To prevent mechanical strain on the connectors, use care when working with SMA connectors: support
equipment and use a torque wrench to tighten connections to 7 in-lbs.
Figure 29: Test system rise time setup
NOTE. The fi rmware of the 80A03 TekConnect Probe Interface used to power the probe must be version V2.2 or above.
42 P7313SMA Technical Reference