Tektronix KEITHLEY 4200A-SCS-PKC Quick Start Manual Download Page 8

Connect the instrument

Important test system safety information

This system contains instruments that can produce 

hazardous voltages. It is the responsibility of the test system 

installer, maintenance personnel, and service personnel to 

make sure the system is safe during use and is operating 

properly. You must also realize that in many test systems a 

single fault, such as a software error, may output hazardous 

signal levels even when the system indicates that there is no 

hazard present.

It is important that you consider the following factors in your 

system design and use:

The international safety standard IEC 61010-1 defines

voltages as hazardous if they exceed 30 V

RMS

 and

42.4 V

PEAK

 or 60 V dc for equipment rated for dry

locations. Keithley Instruments products are only rated for

dry locations.

Read and comply with the specifications of all instruments

in the system. The overall allowed signal levels may be

constrained by the lowest rated instrument in the system.

For example, if you are using a 500 V power supply with

a 300 V dc rated switch, the maximum allowed voltage in

the system is 300 V dc.

• Cover the device under test (DUT) to protect the operator

from flying debris in the event of a system or DUT failure.

Make sure any test fixture connected to the system

protects the operator from contact with hazardous

voltages, hot surfaces, and sharp objects. Use

shields, barriers, insulation, and safety interlocks to

accomplish this.

• Double-insulate all electrical connections that an operator

can touch. Double insulation ensures the operator is

still protected even if one insulation layer fails. Refer to

IEC 61010-1 for specific requirements.

• Make sure all connections are behind a locked cabinet

door or other barrier. This protects the system operator

from accidentally removing a connection by hand and

exposing hazardous voltages. Use high-reliability fail-safe

interlock switches to disconnect power sources when a

test fixture cover is opened.

• Where possible, use automatic handlers so that operators

are not required to access the DUT or other potentially

hazardous areas.

• Provide training to all users of the system so that they

understand all potential hazards and know how to protect

themselves from injury.

• In many systems, during power up, the outputs may be in

an unknown state until they are properly initialized. Make

sure the design can tolerate this situation without causing

operator injury or hardware damage.

Summary of Contents for KEITHLEY 4200A-SCS-PKC

Page 1: ...Model 4200A SCS PKC High Power I V C V Parameter Analyzer Quick Start Guide...

Page 2: ...r high transient overvoltages often associated with local AC mains connections Certain Keithley measuring instruments may be connected to mains These instruments will be marked as category II or highe...

Page 3: ...the associated information very carefully before performing the indicated procedure The CAUTION heading in the user documentation explains hazards that coulddamage the instrument Such damage may inva...

Page 4: ...tive humidity non condensing Storage temperature 15 C to 60 C 5 to 90 relative humidity non condensing CAUTION Carefully consider and configure the appropriate output off state source levels and compl...

Page 5: ...tart Guide This document It provides unpacking instructions describes basic connections reviews basic operation information and provides a quick test procedure to ensure the instrument is operational...

Page 6: ...gns of physical damage Report any damage to the shipping agent immediately CAUTION The 4200A SCS weighs approximately 27 kg 60 lb and requires a two person lift CAUTION Do not lift the 4200A SCS using...

Page 7: ...adapters four 5 CS 701 BNC tee adapters two 6 4200 MTRX ultra low noise SMU triaxial cables two 7 Safety interlock cable 8 4200 PA remote preamplifier two 9 4200 TRX ultra low noise triaxial cables tw...

Page 8: ...the device under test DUT to protect the operator from flying debris in the event of a system or DUT failure Make sure any test fixture connected to the system protects the operator from contact with...

Page 9: ...f the fixture is open It also enables the 4200A SCS to output higher voltages when the exterior enclosure of the fixture is closed When the safety interlock signal is asserted the switch is closed and...

Page 10: ...ge fixtures such as the 8101 PIV are intended for applications that are less than 40 V For these applications an interlock is not needed High voltage test fixtures can be used with applications that a...

Page 11: ...ixture Test connections If you are testing discrete devices you need a test fixture that is equipped with 3 lug triaxial connectors The 8101 PIV test fixture that is included with the 4200A SCS PKC al...

Page 12: ...Connect a test fixture and DUT to the 4200A SCS If you are using the supplied test fixture connect the MOSFET and test fixture as shown in this diagram...

Page 13: ...cable that connects 4200 PA to a test fixture 3 4200 MTRX 1 Ultra low noise SMU triaxial cable mini triaxial connects 4201 SMU units to a test fixture 4 TG 439 nMOSFET DUT 1 Plug into the test socket...

Page 14: ...ounded outlets When proper connections are made the instrument chassis is connected to power line ground through the ground wire in the power cord In addition a redundant protective earth connection i...

Page 15: ...end of the line cord into a properly grounded ac line power receptacle 3 Turn on the 4200A SCS by pushing the power switch The switch is lit when power is on The instrument starts up NOTE When first s...

Page 16: ...to 60 Hz If the setting is wrong the 4200A SCS cannot properly reject the powerline measurement noise To change powerline frequency 1 Close Clarius 2 Run KCon 3 From the System Configuration list sel...

Page 17: ......

Page 18: ...on a MOSFET The first time Clarius opens the project tree is displayed and the default project is loaded The next graphic shows the tests in this project To work with a test 1 Select vds id located un...

Page 19: ...est 2 The vds id settings should be SMU3 Provide a voltage step function for four different gate voltages 2 V 3 V 4 V and 5 V SMU2 Perform a 51 point sweep of drain voltage 0 V to 5 V at each gate vol...

Page 20: ...t only that test will run For example in the following graphic when you select only the vds id test will run In the following example one test is run To run the vds id test 1 In the project tree selec...

Page 21: ...ce of tests check the tests you want to run then check and select the device subsite or project item that contains the tests For example in the following graphic when you click all the checked tests u...

Page 22: ...can use the Analyze sheet which is similar to a Microsoft Excel spreadsheet and the graph To view vds id test results 1 Select Analyze 2 Select an icon next to View to choose the type of information...

Page 23: ...e data graph or both to an external file To save your test data 1 Select Save Data 2 On the Save Test Data As dialog box select one of the following buttons Save Sheet Select this to save only the she...

Page 24: ...Settings button To customize a graph 1 Select Graph Settings 2 To include a Legend and Title select those options from the Graph Settings menu 3 To use different colors for the graph series select Gr...

Page 25: ...I V Test...

Page 26: ...Make connections for the C V test If you are using the supplied test fixture connect the nMOSFET and test fixture as shown in this diagram...

Page 27: ...er Analyzer 1 2 CA 447A cables 4 SMA cable male to male 100 1 5 m 3 4200 MTRX 2 SMA tee adapter female male female 4 TG 439 nMOSFET DUT 1 5 8101 PIV Component Test Fixture 1 Plug into PULSE IV test so...

Page 28: ...osfet This test is located under the 4terminal n fet device In the Configure pane on the next page is where you define the test In the test shown the device is connected to the CVH1 and CVL1 terminals...

Page 29: ...mosfet settings should be CVH1 Default setting which is Voltage Linear Sweep is swept from 5 V to 5 V in 0 2 V steps with a 1 MHz capacitance measurement made at each step CVL1 Default setting which i...

Page 30: ...test is run To run the cv nmosfet test 1 In the project tree select cv nmosfet to highlight it 2 On the toolbar select When the test is running Run shows two arrows circling the icon and Stop turns re...

Page 31: ...ata you can use the Analyze sheet which is similar to a Microsoft Excel spreadsheet or the graph To view cv nmosfet test results 1 Select Analyze 2 Select an icon next to View to choose the type of in...

Page 32: ...n external file To save your test data 1 Select Save Data 2 If you are saving a graph select the Graph File Format 3 On the Save Test Data As dialog box select one of the following buttons Save Sheet...

Page 33: ...graph is shown here In this example the C V curve is measured between the gate and the source drain bulk Notice that the COX CFB and VFB parameters are extracted and displayed on the screen You can cu...

Page 34: ...fixture Also check the connections from the DUT to the test fixture socket I cannot unplug the mini triaxial cable 4200A MTRX from the SMU What should I do The mini triaxial connector is a locking co...

Page 35: ...us Manual Provides comprehensive information about projects tests data analysis data calculation user libraries and customizing Clarius Hardware manuals for setup and maintenance source measure units...

Page 36: ...S and foreign patents issued and pending Information in this publication supersedes that in all previously published material Specification and price change privileges reserved TEKTRONIX and TEK are r...

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