SiT-AN6722EB Manual Rev. 2.0
Page 1 of 8
SiT6722EB Evaluation Board
User Manual
Contents
1 Introduction ............................................................................................................................................. 1
2 I/O Descriptions ....................................................................................................................................... 2
3 EVB Usage Descriptions ........................................................................................................................... 2
3.2 Waveform Capturing Using Active Probe ........................................................................................ 3
3.3 Measuring Jitter and Phase Noise ................................................................................................... 5
3.4 Current Measurement ..................................................................................................................... 5
1
Introduction
The SiT6722EB
evaluation board (EVB) is designed for use with SiTime’s Elite Super-TCXOs in the 10-pin,
5.0 x 3.2 mm ceramic packages. It enables the evaluation of key functionalities of these precision Super-
TCXOs in all three configuration modes including TCXO, VCTCXO and DCTCXO with I
2
C.
EVB Features
-
Support for all three Super-TCXO configuration modes: TCXO, VCTCXO, DCTCXO
-
Probing points for frequency measurements
-
Connector access for controlling the output frequency via I
2
C
-
Connector for current measurement
SiTime typically ships the EVB with the Super-TCXO mounted using SiTime recommended reflow profile.
The Super-TCXO device should only be evaluated in its original soldered down state for best signal
integrity and frequency stability. The device performance is not guaranteed if it is de-soldered and then
re-soldered either manually or via reflow process.
