Seagate ST64022CF, Product Manual

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12 ST1.2 Series Product Manual, Rev. B
2.8.5 Shock
All shock measurements in this section are carried out at drive level. For all linear shock test, operating or non-
operating, the input shock level shall be measured at the frame of the disk drive at the specific location indi-
cated by the red ellipse in Figure 6 below for the CF and interface drives.
Figure 6. Location where tri-axial accelerometer will be placed on ST1.2 drive
All shock test will cover all the 6 directions, +/- x, y and z axes. The drive axis definition in shown in Figure 7
below.
Figure 7. Drive axis definition for ST1.2 drives
2.8.5.1 Operating shock
The drive will be subjected to 10 shocks for each direction. During the shocks, there must be a minimum delay
of 3 seconds between shock pulses. Soft errors and automatic retries are allowed during the test. No data loss
or permanent damage occurs during a half sine shock pulse of:
200 Gs, 1 msec (on-track read at OD)
175 Gs, 2 msec (random write)
2.8.5.2 Nonoperating shock
The nonoperating shock level that the drive can experience without incurring any physical damage when sub-
sequently put into operation is 750 Gs based on a non-repetitive half sine shock pulse of 2 msec duration. The
same applies for shock levels of 1500 Gs, 1 msec pulse duration and 1500 Gs, 0.5 msec pulse duration on
fresh drives for each level.
2.8.6 Vibration
All vibration specifications assume that the drive is mounted securely in a fixture that does not have fixture
resonances in the frequency test range. The input vibration is applied through the disc drive guide rails of the
device under test. Testing is carried out in the x, y and z axes.
S1.2 FX interface drive S1.2 CF interface drive
Finger
Grip Area
S1.2 CF interface drive S1.2 FX interface drive
-y
+y
+z
+x
-x
-z
-y
+y
+z
+x
-x
-z