10.17
Date Code 20020903
SEL-587Z Instruction Manual
Testing and Troubleshooting
Relay Self-Tests
Relay Self-Tests
The SEL-587Z runs a variety of self-tests. The relay takes the following
corrective actions for out-of-tolerance conditions (see
The relay disables protection elements and trip/close logic. All
output contacts are de-energized. The EN front-panel LED is
extinguished.
The ALARM output contact signals an alarm condition by
going to the de-energized state. If the ALARM output contact
is a “b” contact (normally closed), it closes for an alarm
condition or if the relay is de-energized. If the ALARM output
contact is an “a” contact (normally open), it opens for an alarm
condition or if the relay is de-energized. Alarm condition
signaling can be five-second pulses (Pulsed) or permanent
(Latched).
The relay generates automatic STATUS reports at the serial
port for warnings and failures.
The relay displays failure messages on the relay LCD display
for failures.
Use the serial port
STATUS
command or front-panel
{STATUS}
pushbutton
to view relay self-test status.
Table 10.6
Relay Self-Tests
(Sheet 1 of 2)
Self-Test
Condition
Limits
Protection
Disabled
ALARM Output
Description
87A, 87B, 87C, IA,
IB, IC offset
Warning
30 mV
No
Pulsed
Measures the dc offset
at each of the current input
channels every 0.2 seconds.
Master offset
Warning
Failure
20 mV
30 mV
No
Yes
Pulsed
Latched
Measures the dc offset
at the A/D every 0.2 seconds.
+5 V PS
Warning
Failure
+4.75 V
+5.25 V
+4.70 V +5.50 V
No
Yes
Pulsed
Latched
Measures the +5 V
power supply every 0.2 seconds.
±5 V REG
Warning
Failure
±4.65 V
±5.35 V
±4.50 V ±5.50 V
No
Yes
Pulsed
Latched
Measures the regulated 5 V
power supply every 0.2 seconds.
±10 V PS
Warning
Failure
±9.00 V
±11.00 V
±8.00 V
±12.00 V
No
Yes
Pulsed
Latched
Measures the 10 V
power supply every 0.2 seconds
VBAT
Warning
Failure
+2.25 V
+5.00 V
+2.10 V
+6.00 V
No
No
Pulsed
Pulsed
Measures the Real Time clock bat-
tery every 0.2 seconds.
TEMP
Warning
Failure
–40° +85°C
–50° +100°C
No
Yes
Latched
Measures the
temperature at
the A/D voltage
reference every 0.2 seconds.
RAM
Failure
Yes
Latched
Performs a read/write test
on system RAM every 60 seconds.
Summary of Contents for SEL-587Z
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