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21
Operating Procedures
01.4IB.65090A
c. p
rocedure
for
t
eStInG
f
eeder
The CON ED and CUSTOMER ground and test
devices are supplied with similar interlock
functions. However, the CON ED device uses
Key KU for Key Lock K1 and the CUSTOMER
device uses Key KCF for Key Lock K1. Key KU
and Key KCF are NOT INTERCHANGEABLE.
Although these operating procedures contain
illustrations of the CUSTOMER device, these
procedures also apply to the CON ED device.
For procedures that refer to Key KCF for the
CUSTOMER device, the same procedures apply
to Key KU for the CON ED device.
NOTICE
Perform steps 1 through 10 of
Procedures, A. Applying Ground
prior to the
following:
1. Verify that the control selector switch on
the front of the ground and test device is in
the “OFF” (center) position
.
2. Connect the power cord of the remote
control box to the ground and test device
. Ensure the cord is locked into
the connected position by turning the plug
clockwise.
3. Connect the secondary disconnect plug
to the receptacle on the ground and test
device
4. Move the control selector switch from the
“OFF” position to the “CLOSE” position
.
5. Turn the remote control box “ON”
and depress the “CLOSE”
pushbutton
on the control box
to close the ground and test device.
6. Move the control selector switch to the
“OFF” position
and turn the
7. Disconnect the remote control box power
cord from the ground and test device
8. Rotate key KB in key lock K1 to electrically
disable the ground and test device.
9. Transfer key KB to key lock K4. Rotate key
KD
. The ground and test device
is now electrically and mechanically locked
in the “CLOSED” position. The KB key is now
captive and key KD is released.
10. Transfer key KD key to key lock K5. Rotate
key KD to unlock the test port shutters
11. Open the test port shutters using the slide
handle
. With the test ports fully
open, the key lock K5 interlock is blocked
from operating and the key remains
captive.
Figure 7
Test Probe and Cable
12. Install test probes
into the test
ports
. Move the test port
shutter to the left to capture the test probes
in the test probe shutter.
13. Rotate key KD to lock the test probes in the
test ports. Key KD is now released.
14. Transfer key KD to key lock K4
Rotate key KD. Key KD is now captive and
key KB is released.
15. Transfer key KB to key lock K1
.
Rotate key KB. The ground and test device
control circuit is now enabled. Key KB is
now captive and key KCF is now released.