
3 Prevention of Electro Static Discharge (ESD) to
Electrostatically Sensitive (ES) Devices
Some semiconductor (solid state) devices can be damaged easily by static electricity. Such components commonly are called
Electrostatically Sensitive (ES) Devices. Examples of typical ES devices are integrated circuits and some field-effect transistors and
semiconductor "chip" components. The following techniques should be used to help reduce the incidence of component damage
caused by electro static discharge (ESD).
1. Immediately before handling any semiconductor component or semiconductor-equipped assembly, drain off any ESD on your
body by touching a known earth ground. Alternatively, obtain and wear a commercially available discharging ESD wrist strap,
which should be removed for potential shock reasons prior to applying power to the unit under test.
2. After removing an electrical assembly equipped with ES devices, place the assembly on a conductive surface such as
aluminum foil, to prevent electrostatic charge buildup or exposure of the assembly.
3. Use only a grounded-tip soldering iron to solder or unsolder ES devices.
4. Use only an anti-static solder Remove device. Some solder Remove devices not classified as "anti-static (ESD protected)" can
generate electrical charge sufficient to damage ES devices.
5. Do not use freon-propelled chemicals. These can generate electrical charges sufficient to damage ES devices.
6. Do not remove a replacement ES device from its protective package until immediately before you are ready to install it. (Most
replacement ES devices are packaged with leads electrically shorted together by conductive foam, aluminum foil or comparable
conductive material).
7. Immediately before removing the protective material from the leads of a replacement ES device, touch the protective material
to the chassis or circuit assembly into which the device will be installed.
Caution
Be sure no power is applied to the chassis or circuit, and observe all other safety precautions.
8. Minimize bodily motions when handling unpackaged replacement ES devices. (Otherwise hamless motion such as the brushing
together of your clothes fabric or the lifting of your foot from a carpeted floor can generate static electricity (ESD) sufficient to
damage an ES device).
6
TH-65PF9BK / TH-65PF9EK
Summary of Contents for TH-65PF9BK
Page 4: ...1 Applicable signals 4 TH 65PF9BK TH 65PF9EK ...
Page 23: ...7 Location of Lead Wiring 23 TH 65PF9BK TH 65PF9EK ...
Page 24: ...24 TH 65PF9BK TH 65PF9EK ...
Page 27: ...8 4 Adjustment Volume Location 8 5 Test Point Location 27 TH 65PF9BK TH 65PF9EK ...
Page 32: ...9 2 IIC mode structure following items value is sample data 32 TH 65PF9BK TH 65PF9EK ...
Page 34: ...34 TH 65PF9BK TH 65PF9EK ...
Page 36: ...36 TH 65PF9BK TH 65PF9EK ...
Page 42: ...12 Option Setting 42 TH 65PF9BK TH 65PF9EK ...
Page 44: ...NOTE 44 TH 65PF9BK TH 65PF9EK ...
Page 78: ...NOTE TH 65PF9BK TH 65PF9EK 78 ...
Page 79: ...14 1 Schematic Diagram Notes 14 Block and Schematic Diagram TH 65PF9BK TH 65PF9EK 79 ...
Page 148: ...NOTE TH 65PF9BK TH 65PF9EK 148 ...
Page 151: ...15 2 Cable relation 151 TH 65PF9BK TH 65PF9EK ...
Page 152: ...15 3 Packing summary 152 TH 65PF9BK TH 65PF9EK ...
Page 153: ...153 TH 65PF9BK TH 65PF9EK ...
Page 154: ...154 TH 65PF9BK TH 65PF9EK ...
Page 156: ...17 Replacement Parts List 17 1 Replacement Parts List Notes 156 TH 65PF9BK TH 65PF9EK ...