DR
AFT
DR
AFT
DRAFT
DR
D
RAFT
DRAFT
DRA
FT DRAF
D
RAFT DRAFT DRAFT DRAFT DRAFT D
DRAFT
D
RAFT DRA
FT DRAFT DRAFT DRAFT DRA
UM10316_0
© NXP B.V. 2008. All rights reserved.
User manual
Rev. 00.06 — 17 December 2008
46 of 571
NXP Semiconductors
UM10316
Chapter 3: LPC29xx Clock Generation Unit (CGU)
5.16 CGU0 interrupt bit description
gives the interrupts for the CGU0. The first column gives the bit number in the
interrupt registers. For a general explanation of the interrupt concept and a description of
the registers see
.
Table 29.
BUS_DISABLE register bit description (BUS_DISABLE, address 0xFFFF 8FF4
(CGU0) and 0xFFFF BFF4 (CGU1))
* = reset value
Bit
Symbol
Access
Value
Description
31 to 1
reserved
R
-
Reserved; do not modify. Read as logic 0, write
as logic 0
0
RRBUS
R/W
Bus write-disable bit
1
No writes to registers within CGU are possible
(except the BUS_DISABLE register)
0*
Normal operation
Table 30.
CGU interrupt sources
Register
bit
Interrupt source
Description
31 to 12
unused
Unused
11
FDIV6
FDIV 6 activity state change
10
FDIV5
FDIV 5 activity state change
9
FDIV4
FDIV 4 activity state change
8
FDIV3
FDIV 3 activity state change
7
FDIV2
FDIV 2 activity state change
6
FDIV1
FDIV 1 activity state change
5
FDIV0
FDIV 0 activity state change
4
PL160M240
PLL +240
°
activity state change
3
PL160M120
PLL +120
°
activity state change
2
PL160M
PLL activity state change
1
crystal
Crystal-oscillator activity state change
0
LP_OSC
Ring-oscillator activity state change