NXP Semiconductors FRDMGD3160XM3EVM, User Manual

Page: 11 / 38

NXP Semiconductors
UM11620
FRDMGD3160XM3EVM half-bridge evaluation board
Test point Definition
Low-voltage domain
VSUP DC voltage source connection point for VSUP power input of GD3160 devices. Typically supplied by vehicle
b15 V DC.
GND grounding points for low-voltage domain
INTAH fault monitor and VCE/VGE monitor high-side test point
INTBL interrupt bar low-side test point
INTAL fault monitor and VCE/VGE monitor low-side test point
INTBH interrupt bar high-side test point
Low-side driver domain
GNDL low-side domain ground point
VCCL positive voltage supply test point for isolated circuitry and low-side driver domain
VRFL 5.0 V reference test point for isolated analog circuitry on low-side driver
TSNSL temperature sense connection low-side test point
GL module gate test point on low-side driver domain which is the charging pin of gate; including MMCX probe
connection
FSISOL high-voltage domain fail-safe low-side test point
DSTL V
CE
desaturation test point connected to low-side driver DESAT pin and circuitry
VCCREGL VCC regulator low-side test point
VEEL
negative voltage supply test point for low-side driver gate of IGBT or SiC module
CLMPL active clamping low-side test point
VDC DC link voltage test point at voltage divider
COLL collector test point/connection terminal on low side
High-side driver domain
VCCH positive voltage supply test point for isolated circuitry and high-side driver domain
GNDH high-side domain ground point
COLH collector test point/connection high side
TSENSEH temperature sense connection high-side test point
VCCREGH VCC regulator high-side test point
VRFH
5.0 V reference test point for isolated analog circuitry on high-side driver
FSISOH high-voltage domain fail-safe high-side test point
GH module gate test point on high-side driver domain which is the charging pin of gate; including MMCX probe
connection
CLMPH active clamping high-side test point
DSTH V
CE
desaturation test point connected to high-side driver DESAT pin and circuitry
VEEH negative voltage supply test point for high-side driver gate of IGBT or SiC module
AMXH analog MUX input test point for high-side driver
Table 3. Test point definitions
UM11620 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved.
User guide Rev. 1 — 10 June 2021
11 / 38