MI 3122 Smartec Z Line-Loop / RCD
Settings
22
Maximum RCD disconnection times differ in various standards.
The trip-out times defined in individual standards are listed below.
Trip-out times according to EN 61008 / EN 61009:
½
I
N
*)
I
N
2
I
N
5
I
N
General RCDs
(non-delayed)
t
> 300 ms
t
< 300 ms
t
< 150 ms
t
< 40 ms
Selective RCDs
(time-delayed)
t
> 500 ms 130 ms < t
< 500 ms 60 ms < t
< 200 ms 50 ms < t
< 150 ms
Trip-out times according to IEC 60364-4-41:
½
I
N
*)
I
N
2
I
N
5
I
N
General RCDs
(non-delayed)
t
> 999 ms
t
< 999 ms
t
< 150 ms
t
< 40 ms
Selective RCDs
(time-delayed)
t
> 999 ms 130 ms < t
< 999 ms 60 ms < t
< 200 ms 50 ms < t
< 150 ms
Trip-out times according to BS 7671:
½
I
N
*)
I
N
2
I
N
5
I
N
General RCDs
(non-delayed)
t
> 1999 ms
t
< 300 ms
t
< 150 ms
t
< 40 ms
Selective RCDs
(time-delayed) t
> 1999 ms 130 ms < t
< 500 ms 60 ms < t
< 200 ms 50 ms < t
< 150 ms
Trip-out times according to AS/NZS 3017
**)
:
½
I
N
*)
I
N
2
I
N
5
I
N
RCD type
I
N
[mA]
t
t
t
t
Note
I
10
> 999 ms
40 ms
40 ms
40 ms
Maximum break time
II
> 10
30
300 ms 150 ms
40 ms
III
> 30
300 ms 150 ms
40 ms
IV
S
> 30
> 999 ms
500 ms 200 ms 150 ms
130 ms
60 ms
50 ms
Minimum non-actuating time
*)
Minimum test period for current of ½
I
N
, RCD shall not trip-out.
**)
Test current and measurement accuracy correspond to AS/NZS 3017 requirements.
Maximum test times related to selected test current for general (non-delayed) RCD
Standard
½
I
N
I
N
2
I
N
5
I
N
EN 61008 / EN 61009
300 ms
300 ms
150 ms
40 ms
IEC 60364-4-41
1000 ms
1000 ms
150 ms
40 ms
BS 7671
2000 ms
300 ms
150 ms
40 ms
AS/NZS 3017 (I, II, III)
1000 ms
1000 ms
150 ms
40 ms
Maximum test times related to selected test current for selective (time-delayed) RCD
Standard
½
I
N
I
N
2
I
N
5
I
N
EN 61008 / EN 61009
500 ms
500 ms
200 ms
150 ms
IEC 60364-4-41
1000 ms
1000 ms
200 ms
150 ms
BS 7671
2000 ms
500 ms
200 ms
150 ms
AS/NZS 3017 (IV)
1000 ms
1000 ms
200 ms
150 ms
