Adjustment Procedure
HFP1500-OM-E Rev E
8–1
8 Adjustment Procedure
INTRODUCTION
You can use this procedure to adjust the HFP1500 probe to meet the warranted specifications.
This procedure should only be performed if the probe fails to meet the Performance verification
tests for Output Zero or Offset Accuracy.
Gain which affects LF attenuation accuracy cannot be adjusted during routine calibration. Probes
which fail LF frequency accuracy during performance verification must be returned to the factory
for rework.
If the probe cannot be adjusted to meet the Performance verification limits, repair may be neces-
sary.
To assure probe accuracy, check the calibration of the HFP1500 every 1000 hours or once a year
if used infrequently. Before calibration, thoroughly clean and inspect the probe as outlined in the
Care and Maintenance section.
To assure the probe will meet the published specifications over the entire temperature range,
adjustment must be performed in a controlled ambient environment with temperature of 23 °C ±5
°C.
The adjustment procedure will require removal of the probe control circuit cover.
This cover is part of the ESD protection system of the HFP1500. To protect the
probe, you should perform the entire procedure on a static dissipating work sur-
face. Wear an antistatic wrist strap and follow standard static control procedures.
TEST EQUIPMENT REQUIRED
Table 8-1 lists the test equipment and accessories (or their equivalents) that are required for com-
plete calibration of the HFP1500 Probe. Specifications given for the test equipment are the mini-
mum necessary for accurate calibration. All test equipment is assumed to be correctly calibrated
and operating within the specification listed. Detailed operating instructions for the test equipment
are not given in this procedure. Refer to the test equipment manual if more information is needed
If alternate test equipment is substituted, control settings or calibration equipment setups may
need to be altered.
Caution
Summary of Contents for HFP1500
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