HFP1500 High Frequency Probe
4–2
HFP1500-OM-E Rev E
OFFSET
The HFP1500 has true offset capability. This allows you to remove a DC bias voltage from the
input signal while maintaining DC coupling. By using probe offset rather than the ’position’ control
on the oscilloscope, the full dynamic range of the probe remains centered around the offset level,
preventing the oscilloscope from being overdriven and causing inaccurate measurements.
Figure 4-1. Dynamic Range and Offset Effects.
With ±8 V dynamic range and ±12 V offset, the HFP1500 has a measurement range of ±20 V.
When the HFP1500 is used with a LeCroy oscilloscope equipped with ProBus interface, the probe
offset is controlled with the channel
OFFSET
knob.
Note:
At higher frequencies the maximum linear input voltage is reduced. Refer to Sec-
tion 9, Specifications, for the derating curve.
+6 V
+12 V
+10 V
+14 V
+8 V
+4 V
+2 V
0 V
–2 V
–4 V
–6 V
+16 V
+18 V
±8 V
centered
at 0 V
±8 V
window
re-centered
around
probe offset
+6 V
+12 V
+10 V
+14 V
+8 V
+4 V
+2 V
0 V
+16 V
+18 V
A
Input Waveform
B
Waveform clipped
with offset
centered at 0 Volt
C
Offset used to re-center
the dynamic range
10 V
Summary of Contents for HFP1500
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