Kikusui TOS5050A, Operation Manual, Page: 73 / 120

TOS5051A/5050A 6-13
Chap
.6
Test Procedures
6.2.3 Setting the Lower Cutoff Current
This procedure is to set the lower cutoff current, the criterion for pass/fail judgment
on the DUT. If the leak current that
fl ows through the DUT is less than this limit, the
DUT is judged to be FAIL.
If dispersion of leak currents of DUTs is within a predictable range and their lowest
values are within the range detectable with the tester, you may set the low cutoff cur-
rent at a value slightly less than the lowest leak currents. By this setting, you can dis-
criminate DUTs whose leak currents are exceptionally small and can guard against
open-circuiting of the test leads, thereby improving the reliability of test. If this setting
is inconvenient for your test, you can turn OFF the lower pass/fail judgment function.
Setup procedure
1. Select the lower cutoff current setting mode with the UP/LOW key.
The “LOWER” message will appear and the preset lower cutoff current will be
indicated on the CURRENT readout.
2. Adjust the preset lower cutoff current value as required, with the or key.
If you press the SHIFT key at the same time, the adjusting speed is increased
by a factor of ten. The current value is displayed on the CURRENT readout.
3. While holding down the SHIFT key, press the UP/LOW key and the
lower pass/fail judgment function will be brought into effect.
The “LOWER ON” message will appear.
Lower cutoff current setting range
0.1 mA to 11 mA, OFF
Resolutions and display formats
• The keys are enabled when the tester is in the READY status (status that the
“READY” message appears) and the “KEY LOCK” message is OFF. They are
disabled when in the TEST-ON status (status that the “TEST” message appears)
or when the tester is delivering the result of PASS/FAIL judgment (when the
“PASS” message or the “FAIL” message appears).
• Because the upper and lower cutoff currents can be set independently, it is possi-
ble that the latter is set to a value higher than the former. If such setting is used
and the pass/fail judgment function for the lower cutoff current is ON, “mA” (unit
of current measure) blinks and the “READY” message disappears to indicate that
such test condition is not allowed. The READY status resumes and the blinking
stops if the lower cutoff current is set at a value lower than the upper cutoff current
or if the pass/fail judgment function for the lower cutoff current is turned OFF.
• When you turn OFF the POWER switch immediately after you have changed the
cutoff current, no setting value may be stored. Wait for fi ve seconds or more after
the setting change, and then turn OFF the POWER switch.
Lower cutoff current range Basic resolution Display format
0.1 mA to 9.9 mA 0.1 mA X.X mA
10 mA to 11 mA 1 mA XXX mA
NOTE