Keysight W2630 Series DDR2 DRAM BGA Probes Installation Guide
3
DDR2 DRAM BPA Probes - At a Glance
The DDR2 DRAM BGA probe enables logic analyzer state and timing measurements of all the DRAM
buses, including the DQ, DQS, and clock signals of x8 and x16 DRAMs using the JEDEC standard
common DDR2 DRAM footprint.
The probe interposes between the DRAM being probed and the PC board where the DRAM would
normally be soldered. The probe is designed to be soldered to the PCB footprint for the DRAM. The
DRAM being probed is then soldered to the top side of the probe.
Each DRAM signal in the common footprint (including those defined for x8 and x16 DRAMs) passes
directly from the bottom side of the probe to the top side of the probe. Buried probe resistors placed
at the DRAM balls connect the probed signals to the rigid flex to mate with an Keysight cable adapter
(ZIF probe).
The W2630 Series probes are also compatible with the Keysight InfiniiMax oscilloscope probes. This
allows oscilloscope probing of the DRAM signals with an Infiniium 54850, 80000, or 90000 Series
oscilloscope, giving you a DDR2 testing solution covering the clock, electrical and timing parameters
of the JEDEC specification. The W2631B and W2633B probes require the or W2639A adapter for
oscilloscope probing.
The figures below show a probe and the adapter cable which connects the probe to a logic analyzer:
Figure 1
The W2633 DDR2 x8 BGA command and data probe can be used with a logic analyzer or an oscilloscope