20
N2780/1/2/3B User’s Guide
Safe Probing
NOTE
At high frequencies, common mode noise may affect measurements
taken on the high voltage side of circuits. If this occurs, reduce the
frequency range of the waveform measuring instrument or clamp onto
the low
voltage side of the circuit, as appropriate. See
page 20. Although the figure shows an N2782/3B probe, the same
technique is used with an N2780/1B probe.
NOTE
During demagnetization, the demagnetization waveform (a waveform
that attenuates over time) will be output from the device’s output
connector and displayed on the waveform measurement instrument. The
positive and negative components of this waveform may be
asymmetrical, but this does not represent a device malfunction.
Figure 7
Clamp Onto the Low-Voltage Side of Circuit (Shown with N2782B)
