74
Keysight M809256PB OIF CEI-56G Rx Test Automation Application User Guide
5
OIF CEI-56G VSR PAM4 Tests
Test Parameters in Debug Mode
The Debug Mode in the Configure tab of the Test Application consists of
some parameters in addition to those that can be configured in the
Compliance Mode. Besides, for some of the configuration options, you may
enter custom values, which provides a greater flexibility in performing
calibrations and tests.
For each VSR Host Input and VSR Module Input standard options, the
following parameters are available for configuration. Note that other than
the “Test Method” parameter, rest of the parameters appear for both
standard options.
Parameters common for all tests
• Baud Rate
• Victim Generator PAM4 Symbol Mapping
• Victim Generator PAM4 Custom Symbol Mapping
• Victim Analyzer Module—If ‘BERT Analyzer’ is selected, manually
configure the “Victim Analyzer Clock Source” parameter. If ‘DCI’ is
selected, manually configure the “DUT Control Interface script file” and
“DUT Control Interface Location” parameters.
• Victim Analyzer Clock Source
• Victim Analyzer PAM4 Symbol Mapping
• Victim Analyzer PAM4 Custom Symbol Mapping
• Target Error Ratio
• Target Confidence Level
• DUT Control Interface script file
• DUT Control Interface Location
Common Parameter for VSR Host Input tests only
• Test Method
Parameters for Stressed Input Test
• Test Mode
• Jitter Profile Frequency1
• Jitter Profile Amplitude1
• Jitter Profile Frequency2
