Section 3: Test subroutine library reference
S530 Parametric Test System Test Subroutine Library User's Manual
3-4
S530-907-01 Rev. A / September 2015
Example
result = beta2 (e, b, c, sub, ice, vce, &vbeout, &icout, type);
Schematic
beta2a
This subroutine calculates beta (
) at collector-base voltage (V
CB
) and collector-emitter current (I
CE
) using the
searchi
and
trig
LPTLib functions to search emitter current (I
E
) until the target I
CE
is reached. The device is in
the common-base configuration.
Usage
double beta2a(int
e
, int
b
, int
c
, int
sub
, double
ice
, double
vcb
, double
ie1
,
double
ie2
, double
vsub
, double
*icmeas
, double
*ieout
, double
*error
);
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
ice
Input
The targeted collector current, in amperes
vcb
Input
The forced
c
to
b
bias, in volts
ie1
Input
The start of the emitter current search, in amperes
ie2
Input
The end of the emitter current search, in amperes
vsub
Input
The forced substrate bias, in volts
icmeas
Output
The final measured collector-emitter current
ieout
Output
The final forced value of emitter current
error
Output
The percent error between the target collector current (I
CE
) and the final
measured collector current (I
CMEAS
)
Returns
Output
The calculated beta:
-1.0
= Target I
CE
= 0.0
-2.0
= Collector current limit reached
-3.0
= Emitter voltage limit reached
