Section 2: General operation
2606B System SourceMeter® Instrument Reference Manual
2-58
2606B-901-01 Rev. B / May 2018
Use 4-wire remote sensing for the following source-measure conditions:
•
Sourcing or measuring voltage in low impedance (<1
kΩ) test circuits.
•
Enforcing voltage compliance limit directly at the DUT.
When using 4-wire local sensing connections, make sure to properly configure the 2606B
(on page 2-64).
Figure 31: Four-wire connections (remote sensing)
Contact check connections
The contact check function prevents measurement errors due to excessive resistance in the source
or sense leads. See
(on page 2-50) for operation.
Contact check requires both source and sense connections. Refer to
(on page 2-57) for connection scheme.
Multiple SMU connections
Connecting two 2606B channels in parallel or in series may result in voltages or power levels
that exceed the safety mechanisms. This increases the risk of instrument damage and the
possibility of personal injury or death due to electric shock. The user assumes all of the
associated risks of combining the outputs of two or more 2606B channels.
Connections to LO on the 2606B are not necessarily at 0 V. Hazardous voltages could exist
between LO and chassis ground. Make sure that high-voltage precautions are taken
throughout the test system. Alternatively, limit hazardous levels by adding external
protection to limit the voltage between LO and chassis. Failure to make sure high-voltage
precautions are used throughout the test system or a failure to limit hazardous levels could
result in severe personal injury or death from electric shock.
Carefully consider and configure the appropriate output-off state, source, and compliance
limits before connecting the 2606B to a device that can deliver energy (for example, other
voltage sources, batteries, capacitors, solar cells, or other 2606B instruments). Configure
recommended instrument settings before making connections to the device. Failure to
consider the output-off state, source, and compliance limits may result in damage to the
instrument or to the device under test (DUT).