![background image](http://html2.mh-extra.com/html/keithley/2302/2302_instruction-manual_3932733111.webp)
Long Integration Measurements 4-15
Command notes (long integration measurements)
SENSe[1]:FUNCtion ‘LINTegration’
Applies to battery channel (#1)
SENSe2:FUNCtion ‘LINTegration’
Applies to charger channel (#2)
The parameter name can be enclosed in single or double quotes (single — shown above,
double — shown in Table 4-2).
SENSe[1]:LINTegration:SEARch <b>
Applies to battery channel (#1)
SENSe2:LINTegration:SEARch <b>
Applies to charger channel (#2)
Refer to “Using FAST, SEARch, and DETect” for detailed usage information.
SENSe[1]:LINTegration:FAST <b>
Applies to battery channel (#1)
SENSe2:LINTegration:FAST <b>
Applies to charger channel (#2)
Refer to “Using FAST, SEARch, and DETect” for detailed usage information.
SENSe[1]:LINTegration:DETect <b>
Applies to battery channel (#1)
SENSe2:LINTegration:DETect <b>
Applies to charger channel (#2)
Refer to “Using FAST, SEARch, and DETect” for detailed usage information.
READ[1]?
Applies to battery channel (#1)
READ2?
Applies to charger channel (#2)
After sending a trigger reading command to perform long integration measurements, do
not address the power supply to talk until all readings are completed. Details on READ?
and the other signal oriented measurement commands are provided in Section 10.
Using FAST, SEARch, and DETect
Use FAST, SEARch, and DETect to control how background readings are taken.
A
background reading is a measurement taken by the power supply between user triggered
readings. The selected function dictates how background readings are taken between user
triggered readings.
For long integration, a background reading involves looking for the pulse and optionally gen-
erating a reading for the user. The various settings of SEARch, FAST and DETect allow the user
to fine tune the function. This enables the function to perform the desired background readings
(if any) between user triggered readings. The default settings (FAST:OFF, SEARch:ON, and
DETect:OFF) allow the long integration background readings to be taken. If no pulse is present,
the setting of TimeOUT affects how responsive the supply is to bus commands. If a pulse is
present, the search time plus reading time (TIME setting) affects how responsive the supply is
to bus commands (refer to
contains the available settings for
FAST, SEARch, and DETect commands and a description of the resulting action. For more
information on search time, reading time, and TimeOUT,
see “Pulse timeout” on page 4-4
Test Equipment Depot - 800.517.8431 - 99 Washington Street Melrose, MA 02176
TestEquipmentDepot.com
Summary of Contents for 2302
Page 2: ...Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com...
Page 4: ...Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com...
Page 16: ...Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com...
Page 22: ...Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com...
Page 344: ...Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com...
Page 346: ...Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com...
Page 347: ...Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com...