42 SLIT LAMP HS- 7500------------------- ----------------------------------------------------------------
11.6. Guidance and manufacturer’s declaration – electromagnetic
immunity
Immunity
test
IEC 60601
test level
Compliance
level
Electromagnetic environment -
guidance
The EUT is intended for use in the electromagnetic environment specified below.
The customer or the user of the EUT should assure that it is used in such an
electromagnetic environment.
Conducted
RF
IEC
61000-4-6
Radiated
RF
IEC
61000-4-3
3 Vrms
150 kHz to
80MHz
3 V/m
80 MHz to
2.5GHz
3 Vrms
150 kHz to
80MHz
3 V/m
80MHz to
2.5GHz
The EUT must be used only in a
shielded location with a minimum RF
shielding effectiveness and, for each
cable that enters the shielded
location with a minimum RF shielding
effectiveness and, for each cable that
enters the shielded location
Field strengths outside the shielded
location from fixed RF transmitters,
as determined by an
electromagnetic site survey, should
be less than 3V/m.
a
Interference may occur in the vicinity
of equipment marked with the
following symbol:
Summary of Contents for HS-7500
Page 1: ...SLIT LAMP HS 7500 1 Operator s Manual SLIT LAMP MICROSCOPE HS 7500...
Page 21: ...SLIT LAMP HS 7500 21 Figure 2 Composition I...
Page 22: ...22 SLIT LAMP HS 7500 Figure 3 Composition...
Page 23: ...SLIT LAMP HS 7500 23 Figure 4 Composition...
Page 28: ...28 SLIT LAMP HS 7500 Figure 7 Assembling the instrument...
