Figure
3-1.
Simplified
Pulsed-RF
Netw
ork
Analyzer
Block
Diagram
Using
a
wider
bandwidth
in
b oth
the
reference
and
the
test
IF,
sync
hronous
detectors
that
op erate
at
20
MHz,
and
accurate
measuremen
t
sample
timing
circuits
allo w
exible
analysis
of
device
resp onse
during
the
pulse.
With
the
sources
and
test
set
con
trolled
b
y
the
HP
8510
o
v
er
the
8510
system
bus,
and
with
all
necessary
pulse
generation
and
measuremen
t
timing
signals
generated
in
ternally
from
a
common
10
MHz
reference,
the
HP
85108
is
a
complete
pulsed-RF
stimulus/resp onse
test
system.
One
pulse
of
a
user-sp ecied
width
is
measured
at
eac
h
data
p oint
and
the
measuremen
t
is
sync
hronized
so
that
it
is
made
at
a
certain
kno
wn
time
in
the
pulse.
The
stimulus
dut
y
cycle
can
b e
predicted
for
a
given
instrumen
t
state,
but
the
actual
pulse
rep etition
p erio
d
dep ends
up on
the
curren
t
domain,
cal
t
yp e,
a
v
eraging,
sw
eep
time,
and
pulse
width
selections.
F
or
this
reason,
if
y
our
device
is
sensitive
to
dut
y
cycle,
refer
to
General
Timing
Information
in
this
c
hapter.
Either
the
in
ternal
logic,
the
TTL
T
rigger
Input,
or
the
HP-IB
Group
Execute
T
rigger
from
an
external
con
troller
can
initiate
a
measuremen
t
cycle.
When
con
trol
of
the
pulse
rep etition
p erio
d
and
dut
y
cycle
is
required,
the
HP
8510
can
use
the
trigger
input
to
sync
hronize
with
the
in
ternal
or
an
external
pulse
mo
dulator.
The
HP
8510
Stop
Sw
eep
output
can
b e
used
as
a
gating
signal
to
tell
when
the
analyzer
is
ready
for
the
next
measuremen
t.
The
measuremen
t
is
made
with
100
nanosecond
resolution
and
ab out
200
picosecond
uncertain
t
y
with
resp ect
to
the
in
ternally{
or
externally{generated
measuremen
t
trigger.
HP
85110
S-P
arameter
T
est
Set
Operation
Figure
3-2
sho
ws
a
detailed
diagram
of
the
HP
85110-series
test
set
signal
separation,
signal
routing,
and
frequency
con
v
ersion.
This
is
a
fundamen
tally
mixed
test
set,
pro
viding
four
20
Mhz
outputs
to
the
net
w
ork
analyzer.
Placemen
t
of
a
0
to
90
db
(10
dB/step)
attenuator
b efore
eac
h
mixer
pro
vides
con
trol
of
the
signal
lev
els
in
to
the
mixers
while
allo wing
op eration
at
high
POR
T
1
and
POR
T
2
signal
lev
els
necessary
in
man
y
pulsed-RF
applications.
The
test
set
has
rear
panel
access
links
to
allo
w
in
tegration
of
additional
test
and
signal
conditioning
equipmen
t
in
the
low-loss
main
signal
paths
to
the
test
p orts.
If
y
our
device
exhibits
more
than
ab out
20
dB
of
gain,
or
higher
p ort
signal
lev
els
are
required,
refer
to
the
High
P
o
w
er
Measuremen
ts
section
in
this
c
hapter.
3-2
Operation
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