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Super-high-accuracy, multi-channel resistance meter
for use in advanced development and production applications
RM3545
The RM3545 can perform measurement at a resolution of 10 μΩ at 1 mA
(using the 1,000 mΩ range). With an open-terminal voltage of 20 mV or
less, the instrument is ideally suited for measuring the contact resistance
of chip inductors and signal contacts.
Low-power (LP) resistance measurement
The RM3545 converts resistance measured values into DC voltage
for output. This capability is convenient when continuously recording
changes in resistance, for example as detected by a sensor, with a logger
or other piece of equipment.
D/A output
High/low current selection by range
Select the optimal measurement current by switching between high and
low settings according to the characteristics of the sample.
Temperature input (temperature sensor terminal)
Input temperature data for use in temperature correction using either the
Temperature Sensor Z2001 or a DC voltage (0 to 2 V). Connect a ther-
mometer that can generate DC voltage output, for example an infrared
thermometer, to perform temperature correction.
Temperature conversion function:
Useful in temperature-rise testing
Temperature increase (Δt) is obtained and displayed by converting resis-
tance measurements and ambient temperature.
Extensive contact check functionality
The RM3545 can detect erroneous
measurements caused by improp-
er contact, reducing the risk that
improperly judged or unchecked
parts will be shipped by mistake.
Contact check functionality is also
provided for 4-terminal measure-
ment.
High contact resistance indi-
cates an error.
Time
R
RM3545
Logger
Auto-scanning and step scanning
When using the Multiplexer Unit Z3003 to perform scanning measure-
ment, you can select either step scanning or auto scanning depending on
the test conditions.
Auto scanning is convenient when you require only an overall judgment
result at the completion of scanning, while step scanning is convenient
when you wish to generate judgments in real time using the instrument’s
EXT I/O interface..
Measurement targets that are susceptible to the effects of temperature, for
example thermistors and temperature transducers, can be compared with
a reference element to generate a judgment.
Comparator judgments based on
measurement results
The ability to freely combine A terminal pin(s) with B terminal pin(s) for
each channel makes it possible to perform measurement using wiring that
has been optimized for a variety of measurement targets.
Flexible pin assignments
Multiplexer settings can be configured using the keys on the instrument,
communications commands, or a computer application (sample PC appli-
cation). The sample application can be downloaded from Hioki’s website
(http://www.hioki.com).
Configuration using a computer
The multiplexer’s total judgment result (T_PASS, T_FAIL, T_ERR) can
be acquired from EXT I/O. Similarly, step scan judgment results can be
acquired for each step.
Acquiring Total judgment results from EXT I/O
RM3545
Key Features of the RM3545
TRIG signal input
CH1 measurement
CHn measurement
Overall judgment
output
Operation when auto
scanning is selected
Operation when step
scanning is selected
Overall judgment
output
TRIG signal input
CH1 measurement
CH1 judgment output
TRIG signal input
CH1 measurement
CH1 judgment output
Multiplexer function (RM3545
-02
only)
RM3545
-02
