Fluke 1550B, User Manual

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1550B
Users Manual
14
Polarization Index (PI)
As part of the insulation test, the Meter measures and stores polarization index
(PI), when appropriate. Since, by definition, a polarization index test requires 10
minutes to complete, it is measured and stored as invalid data for all insulation
tests under 10 minutes. When an insulation test is 10 minutes or more the
polarization test is completed and stored. The results are available for display
during a test by pressing the
R
button or by storing the test results and
scanning the
RESULTS
fields. The field is identified by
PI=
.
min 1
min 10
×
×
=
R
R
PI
Dielectric Absorption Ratio
As part of the insulation test, the Meter measures and stores dielectric
absorption ratio (DAR), when appropriate. Since, by definition, a DAR test
requires 1 minute to complete, it is measured and stored as invalid data for all
insulation tests under 1 minute. When an insulation test is 1 minute or more the
DAR test is included in the results. The results are available for display during a
test by pressing the
R
button or by storing the test results and scanning the
RESULTS
fields. The field is identified by
DAR=
.
sec 30
min 1
×
×
=
R
R
DAR
Capacitance
As part of the insulation test, the Meter measures and stores capacitance when
appropriate. The results are available for display during a test by pressing the
R
button or by storing the test results and scanning the
RESULTS
fields. The
field is identified by
C=
.
Performing an Insulation Test
XW
Warning
Measuring insulation resistance requires the application of
potentially dangerous voltages to the circuit. This may include
exposed bonded metalwork.
To avoid possible electric shock or personal injury:
•
Remove all power from the circuit under test and discharge circuit
capacitance before testing a circuit with the Meter.
•
Before proceeding, ensure that the installation is wired correctly and
no personnel are endangered by any tests.
•
First connect the test leads to the Meter inputs before you make
connection to the circuit under test.