CY7C1471V25
CY7C1473V25
CY7C1475V25
Document #: 38-05287 Rev. *I
Page 23 of 32
Switching Characteristics
Over the Operating Range. Timing reference level is 1.25V when V
DDQ
= 2.5V and is 0.9V when V
DDQ
= 1.8V. Test conditions
shown in (a) of
“AC Test Loads and Waveforms” on page 22
unless otherwise noted.
Parameter
Description
133 MHz
100 MHz
Unit
Min
Max
Min
Max
t
POWER
1
1
ms
Clock
t
CYC
Clock Cycle Time
7.5
10
ns
t
CH
Clock HIGH
2.5
3.0
ns
t
CL
Clock LOW
2.5
3.0
ns
Output Times
t
CDV
Data Output Valid After CLK Rise
6.5
8.5
ns
t
DOH
Data Output Hold After CLK Rise
2.5
2.5
ns
t
CLZ
Clock to Low-Z
[16, 17, 18]
3.0
3.0
ns
t
CHZ
Clock to High-Z
[16, 17, 18]
3.8
4.5
ns
t
OEV
OE LOW to Output Valid
3.0
3.8
ns
t
OELZ
OE LOW to Output Low-Z
[16, 17, 18]
0
0
ns
t
OEHZ
OE HIGH to Output High-Z
[16, 17, 18]
3.0
4.0
ns
Setup Times
t
AS
Address Setup Before CLK Rise
1.5
1.5
ns
t
ALS
ADV/LD Setup Before CLK Rise
1.5
1.5
ns
t
WES
WE, BW
X
Setup Before CLK Rise
1.5
1.5
ns
t
CENS
CEN Setup Before CLK Rise
1.5
1.5
ns
t
DS
Data Input Setup Before CLK Rise
1.5
1.5
ns
t
CES
Chip Enable Setup Before CLK Rise
1.5
1.5
ns
Hold Times
t
AH
Address Hold After CLK Rise
0.5
0.5
ns
t
ALH
ADV/LD Hold After CLK Rise
0.5
0.5
ns
t
WEH
WE, BW
X
Hold After CLK Rise
0.5
0.5
ns
t
CENH
CEN Hold After CLK Rise
0.5
0.5
ns
t
DH
Data Input Hold After CLK Rise
0.5
0.5
ns
t
CEH
Chip Enable Hold After CLK Rise
0.5
0.5
ns
Notes
15. This part has a voltage regulator internally; t
POWER
is the time that the power needs to be supplied above V
DD
(minimum) initially, before a read or write operation
can be initiated.
16. t
CHZ
, t
CLZ
,t
OELZ
, and t
OEHZ
are specified with AC test conditions shown in part (b) of
“AC Test Loads and Waveforms” on page 22
. Transition is measured ±200 mV
from steady-state voltage.
17. At any supplied voltage and temperature, t
OEHZ
is less than t
OELZ
and t
CHZ
is less than t
CLZ
to eliminate bus contention between SRAMs when sharing the same
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve High-Z before Low-Z under the same system conditions.
18. This parameter is sampled and not 100% tested.
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