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CY7C1381D, CY7C1381F

CY7C1383D, CY7C1383F

Document #: 38-05544 Rev. *F

Page 6 of 29

Pin Definitions

Name

IO

Description

A

0

, A

1

, A

Input-

Synchronous

Address inputs used to select one of the address location

s. Sampled at the rising edge

of the CLK if ADSP or ADSC is active LOW, and CE

1

,

 

CE

2

, and

 

CE

[2] 

are sampled active.

A

[1:0]

 feed the 2-bit counter.

BW

A

, BW

B

BW

C

, BW

D

Input-

Synchronous

Byte write select inputs, active LOW

. Qualified with BWE to conduct byte writes to the

SRAM. Sampled on the rising edge of CLK.

GW

Input-

Synchronous

Global write enable input, active LOW

. When asserted LOW on the rising edge of CLK, a

global write is conducted (all bytes are written, regardless of the values on BW

[A:D] 

and BWE).

CLK

Input-

Clock

Clock input

. Used to capture all synchronous inputs to the device. Also used to increment

the burst counter when ADV is asserted LOW, during a burst operation.

CE

1

Input-

Synchronous

Chip enable 1 input, active LOW

. Sampled on the rising edge of CLK. Used in conjunction

with CE

2

 and CE

[2]

 to select or deselect the device. ADSP is ignored if CE

1

 is HIGH. CE

1

is sampled only when a new external address is loaded.

CE

2

Input-

Synchronous

Chip enable 2 input, active HIGH

. Sampled on the rising edge of CLK. Used in conjunction

with CE

1

 and CE

[2]

 to select or deselect the device. CE

is sampled only when a new

external address is loaded.

CE

[2]

Input-

Synchronous

Chip enable 3 input, active LOW

. Sampled on the rising edge of CLK. Used in conjunction

with CE

1

 and CE

2

 to select or deselect the device. CE

3

 is sampled only when a new external

address is loaded.

OE

Input-

Asynchronous

Output enable, asynchronous input, active LOW

. Controls the direction of the IO pins.

When LOW, the IO pins behave as outputs. When deasserted HIGH, IO pins are tri-stated,
and act as input data pins. OE is masked during the first clock of a read cycle when emerging
from a deselected state. 

ADV

Input-

Synchronous

Advance input signal. 

Sampled on the rising edge of CLK. When asserted, it automatically

increments the address in a burst cycle.

ADSP

Input-

Synchronous

Address strobe from processor, sampled on the rising edge of CLK, active LOW

.

When asserted LOW, addresses presented to the device are captured in the address
registers. A

[1:0]

 are also loaded into the burst counter. When ADSP and ADSC are both

asserted, only ADSP is recognized. ASDP is ignored when CE

1

 is deasserted HIGH.

ADSC

Input-

Synchronous

Address strobe from controller, sampled on the rising edge of CLK, active LOW

.

When asserted LOW, addresses presented to the device are captured in the address
registers. A

[1:0]

 are also loaded into the burst counter. When ADSP and ADSC are both

asserted, only ADSP is recognized.

BWE

Input-

Synchronous

Byte write enable input, active LOW

. Sampled on the rising edge of CLK. This signal

must be asserted LOW to conduct a byte write.

ZZ

Input-

Asynchronous

ZZ sleep input

. This active HIGH input places the device in a non-time critical sleep

condition with data integrity preserved. For normal operation, this pin has to be LOW or left
floating. ZZ pin has an internal pull down.

DQ

s

IO-

Synchronous

Bidirectional data IO lines

. As inputs, they feed into an on-chip data register that is

triggered by the rising edge of CLK. As outputs, they deliver the data contained in the
memory location specified by the addresses presented during the previous clock rise of the

read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the
pins behave as outputs. When HIGH, DQ

s

 and DQP

X

 are placed in a tri-state condition.The

outputs are automatically tri-stated during the data portion of a write sequence, during the
first clock when emerging from a deselected state, and when the device is deselected,
regardless of the state of OE.

DQP

X

IO-

Synchronous

Bidirectional data parity IO lines.

 Functionally, these signals are identical to DQ

s

.

 

During

write sequences, DQP

X

 is controlled by BW

correspondingly.

[+] Feedback 

Summary of Contents for CY7C1381D

Page 1: ...y a positive edge triggered clock input CLK The synchronous inputs include all addresses all data inputs address pipelining chip enable CE1 depth expansion chip enables CE2 and CE3 2 burst control inp...

Page 2: ...E CE1 CE2 CE3 OE GW SLEEP DQA DQP A BYTE WRITE REGISTER DQB DQP B WRITE REGISTER DQC DQP C WRITE REGISTER BYTE WRITE REGISTER DQD DQP D BYTE WRITE REGISTER DQD DQP D BYTE WRITE REGISTER DQC DQP C WRIT...

Page 3: ...5 64 63 62 61 60 59 58 57 56 55 54 53 52 51 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 MODE CY7C1381D 512K x 36 VSS DNU A A A A A 1 A 0 NC NC V SS V DD A A A A A A A A A NC NC VDDQ V...

Page 4: ...VDD DQD DQD DQD DQD ADSC NC CE1 OE ADV GW VSS VSS VSS VSS VSS VSS VSS VSS DQPA MODE DQPD DQPB BWB BWC NC VDD NC BWA NC BWE BWD ZZ 2 3 4 5 6 7 1 A B C D E F G H J K L M N P R T U VDDQ NC 288M NC 144M...

Page 5: ...DQB DQB NC DQB NC DQA DQA VDD VDDQ VDD VDDQ DQB VDD NC VDD DQA VDD VDDQ DQA VDDQ VDD VDD VDDQ VDD VDDQ DQA VDDQ A A VSS A A A DQB DQB DQB ZZ DQA DQA DQPA DQA A VDDQ A CY7C1383D 1M x 18 A0 A VSS 2 3 4...

Page 6: ...m a deselected state ADV Input Synchronous Advance input signal Sampled on the rising edge of CLK When asserted it automatically increments the address in a burst cycle ADSP Input Synchronous Address...

Page 7: ...initiated when the following conditions are satisfied at clock rise 1 CE1 CE2 CE3 2 are all asserted active and 2 ADSP is asserted LOW The addresses presented are loaded into the address register and...

Page 8: ...can follow either a linear or interleaved burst order The burst order is determined by the state of the MODE input A LOW on MODE will select a linear burst sequence A HIGH on MODE will select an inte...

Page 9: ...H D Write Cycle Continue Burst Next H X X L X H L L X L H D Read Cycle Suspend Burst Current X X X L H H H H L L H Q Read Cycle Suspend Burst Current X X X L H H H H H L H Tri State Read Cycle Suspen...

Page 10: ...D A DQD DQA DQPD DQPA H L L H H L Write Bytes D B DQD DQA DQPD DQPA H L L H L H Write Bytes D B A DQD DQB DQA DQPD DQPB DQPA H L L H L L Write Bytes D B DQD DQB DQPD DQPB H L L L H H Write Bytes D B A...

Page 11: ...MSB of any register See TAP Controller Block Diagram Test Data Out TDO The TDO output ball is used to serially clock data out from the registers The output is active depending upon the current state...

Page 12: ...aded into the instruction register upon power up or whenever the TAP controller is given a test logic reset state SAMPLE Z The SAMPLE Z instruction causes the boundary scan register to be connected be...

Page 13: ...ed but are reserved for future use Do not use these instructions TAP Timing TAP AC Switching Characteristics Over the Operating Range 10 11 Parameter Description Min Max Unit Clock tTCYC TCK Clock Cyc...

Page 14: ...uivalent TDO 1 5V 20pF Z 50 O 50 TDO 1 25V 20pF Z 50 O 50 TAP DC Electrical Characteristics And Operating Conditions 0 C TA 70 C VDD 3 3V 0 165V unless otherwise noted 12 Parameter Description Conditi...

Page 15: ...can Order 165 ball fBGA package 89 89 Identification Codes Instruction Code Description EXTEST 000 Captures Input Output ring contents Places the boundary scan register between TDI and TDO Forces all...

Page 16: ...L5 28 E6 50 B3 72 L2 7 R6 29 D6 51 A3 73 N2 8 U6 30 C7 52 C2 74 P2 9 R7 31 B7 53 A2 75 R3 10 T7 32 C6 54 B1 76 T1 11 P6 33 A6 55 C1 77 R1 12 N7 34 C5 56 D2 78 T2 13 M6 35 B5 57 E1 79 L3 14 L7 36 G5 5...

Page 17: ...H3 8 P9 38 B9 68 J1 9 P10 39 C10 69 K1 10 R10 40 A8 70 L1 11 R11 41 B8 71 M1 12 H11 42 A7 72 J2 13 N11 43 B7 73 K2 14 M11 44 B6 74 L2 15 L11 45 A6 75 M2 16 K11 46 B5 76 N1 17 J11 47 A5 77 N2 18 M10 48...

Page 18: ...ge 17 for 3 3V IO 2 0 VDD 0 3V V for 2 5V IO 1 7 VDD 0 3V V VIL Input LOW Voltage 17 for 3 3V IO 0 3 0 8 V for 2 5V IO 0 3 0 7 V IX Input Leakage Current except ZZ and MODE GND VI VDDQ 5 5 A Input Cur...

Page 19: ...ce Junction to Ambient Test conditions follow standard test methods and procedures for measuring thermal impedance in accordance with EIA JESD51 28 66 23 8 20 7 C W JC Thermal Resistance Junction to C...

Page 20: ...5 0 5 ns tADH ADSP ADSC Hold After CLK Rise 0 5 0 5 ns tWEH GW BWE BW A D Hold After CLK Rise 0 5 0 5 ns tADVH ADV Hold After CLK Rise 0 5 0 5 ns tDH Data Input Hold After CLK Rise 0 5 0 5 ns tCEH Ch...

Page 21: ...DV tOEHZ tCDV SingleREAD BURST READ tOEV tOELZ tCHZ Burstwrapsaround toitsinitialstate t ADVH t ADVS t WEH t WES tADH tADS Q A2 Q A2 1 Q A2 2 Q A1 Q A2 Q A2 1 Q A2 2 Q A2 3 A2 ADVsuspendsburst Deselec...

Page 22: ...D A1 D A3 D A3 1 D A3 2 D A2 3 A2 A3 Extended BURST WRITE D A2 2 Single WRITE tADH tADS tADH tADS t OEHZ tADVH tADVS tWEH tWES t DH t DS t WEH t WES Byte write signals are ignored for rst cycle when...

Page 23: ...CES Single WRITE D A3 A3 A4 BURST READ Back to Back READs High Z Q A2 Q A4 Q A4 1 Q A4 2 Q A4 3 t WEH t WES t OEHZ tDH tDS tCDV tOELZ A1 A5 A6 D A5 D A6 Q A1 Back to Back WRITEs DON T CARE UNDEFINED A...

Page 24: ...ZZ I SUPPLY CLK ZZ t ZZREC ALL INPUTS except ZZ DON T CARE I DDZZ t ZZI tRZZI Outputs Q High Z DESELECT or READ Only Notes 30 Device must be deselected when entering ZZ mode See Truth Table 4 5 6 7 8...

Page 25: ...ball Ball Grid Array 14 x 22 x 2 4 mm Pb Free CY7C1383F 133BGXI CY7C1381D 133BZI 51 85180 165 ball Fine Pitch Ball Grid Array 13 x 15 x 1 4 mm CY7C1383D 133BZI CY7C1381D 133BZXI 51 85180 165 ball Fin...

Page 26: ...TRUSION END FLASH SHALL NOT EXCEED 0 0098 in 0 25 mm PER SIDE 3 DIMENSIONS IN MILLIMETERS BODY LENGTH DIMENSIONS ARE MAX PLASTIC BODY SIZE INCLUDING MOLD MISMATCH 0 30 0 08 0 65 20 00 0 10 22 00 0 20...

Page 27: ...CY7C1381D CY7C1381F CY7C1383D CY7C1383F Document 38 05544 Rev F Page 27 of 29 Figure 2 119 ball BGA 14 x 22 x 2 4 mm 51 85115 Package Diagrams continued 51 85115 B Feedback...

Page 28: ...a trademark of Intel Corporation All product and company names mentioned in this document are the trademarks of their respective holders Figure 3 165 ball FBGA 13 x 15 x 1 4 mm 51 85180 Package Diagr...

Page 29: ...nd 6 2 C W respectively Changed JA and JC for FBGA Package from 46 and 3 C W to 20 7 and 4 0 C W respectively Modified VOL VOH test conditions Removed comment of Pb free BG packages availability below...

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