background image

CY62147DV18

MoBL2™

Document #: 38-05343 Rev. *B

Page 5 of 11

 wqewqewq

Data Retention Waveform

[9]

Switching Characteristics 

Over the Operating Range 

[10.]

Parameter

Description

55 ns

70 ns

Unit

Min.

Max.

Min.

Max.

Read Cycle 

t

RC

Read Cycle Time

55

70

ns

t

AA

Address to Data Valid

55

70

ns

t

OHA

Data Hold from Address Change

10

10

ns

t

ACE

CE LOW to Data Valid

55

70

ns

t

DOE

OE LOW to Data Valid

25

35

ns

t

LZOE

OE LOW to LOW Z

[11]

5

5

ns

t

HZOE

OE HIGH to High Z

[11, 12]

16

16

ns

t

LZCE

CE LOW to Low Z

[11]

10

10

ns

t

HZCE

CE HIGH to High Z

[11, 12]

20

25

ns

t

PU

CE LOW to Power-Up

0

0

ns

t

PD

CE HIGH to Power-Down

55

70

ns

t

DBE

BLE / BHE LOW to Data Valid

55

70

ns

t

LZBE

BLE / BHE LOW to Low Z

[11]

10

10

ns

t

HZBE

BLE / BHE HIGH to HIGH Z

[11, 12]

20

25

ns

Write Cycle

[13]

t

WC

Write Cycle Time

55

70

ns

t

SCE

CE LOW to Write End

40

50

ns

t

AW

Address Set-up to Write End

40

50

ns

t

HA

Address Hold from Write End

0

0

ns

t

SA

Address Set-up to Write Start

0

0

ns

t

PWE

WE Pulse Width

40

45

ns

t

BW

BLE / BHE LOW to Write End

40

50

ns

t

SD

Data Set-Up to Write End

25

30

ns

t

HD

Data Hold from Write End

0

0

ns

t

HZWE

WE LOW to High-Z

[11, 12]

20

25

ns

t

LZWE

WE HIGH to Low-Z

[11]

10

10

ns

Notes:

9.

BHE.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signal or by disabling both BHE and BLE.

10. Test conditions for all parameters other than three-state parameters assume signal transition time of 1V/ns or less, timing reference levels of V

CC(typ)

/2, input 

pulse levels of 0 to V

CC(typ.)

, and output loading of the specified I

OL

/I

OH

 as shown in the “AC Test Loads and Waveforms” section.

11. At any given temperature and voltage condition, t

HZCE

 is less than t

LZCE

, t

HZBE

 is less than t

LZBE

, t

HZOE

 is less than t

LZOE

, and t

HZWE

 is less than t

LZWE

 for any 

given device.

12. t

HZOE

, t

HZCE

, t

HZBE

, and t

HZWE

 transitions are measured when the outputs enter a high impedence state.

13. The internal Write time of the memory is defined by the overlap of WE, CE

 

= V

IL

, BHE and/or BLE = V

IL

. All signals must be ACTIVE to initiate a write and any 

of these signals can terminate a write by going INACTIVE. The data input set-up and hold timing should be referenced to the edge of the signal that terminates 

the write. 

V

CC(min)

V

CC(min)

t

CDR

V

DR

> 1.0 V

DATA RETENTION MODE

t

R

V

CC

CE or
BHE.BLE 

[+] Feedback 

Summary of Contents for CY62147DV18

Page 1: ...ted CE HIGH outputs are dis abled OE HIGH both Byte High Enable and Byte Low Enable are disabled BHE BLE HIGH or during a write operation CE LOW and WE LOW Writing to the device is accomplished by asserting Chip En able CE and Write Enable WE inputs LOW If Byte Low Enable BLE is LOW then data from I O pins I O0 through I O7 is written into the location specified on the address pins A0 through A17 ...

Page 2: ...ng or tied to Vss to ensure proper application 4 Pins H1 G2 and H6 in the BGA package are address expansion pins for 8 Mb 16 Mb and 32 Mb respectively WE A11 A10 A6 A0 A3 CE I O10 I O8 I O9 A4 A5 I O11 I O13 I O12 I O14 I O15 VSS A9 A8 OE Vss A7 I O0 BHE NC A17 A2 A1 BLE VCC I O2 I O1 I O3 I O4 I O5 I O6 I O7 A15 A14 A13 A12 NC NC NC 3 2 6 5 4 1 D E B A C F G H A16 DNU Vcc Feedback ...

Page 3: ...10 12 CY62147DV18L 1 65 1 8 2 25 70 1 0 2 0 6 15 0 5 18 CY62147DV18LL 10 12 Electrical Characteristics Over the Operating Range Parameter Description Test Conditions CY62147DV18 55 CY62147DV18 70 Unit Min Typ 7 Max Min Typ 7 Max VOH Output HIGH Voltage IOH 0 1 mA VCC 1 65V 1 4 1 4 V VOL Output LOW Voltage IOL 0 1 mA VCC 1 65V 0 2 0 2 V VIH Input HIGH Voltage VCC 1 65V to 2 25V 1 4 VCC 0 2V 1 4 VCC...

Page 4: ... 4 5 inch four layer printed circuit board 75 C W ΘJC Thermal Resistance Junction to Case 8 10 C W AC Test Loads and Waveforms Parameters 1 80V Unit R1 13500 Ω R2 10800 Ω RTH 6000 Ω VTH 0 80 V Data Retention Characteristics Over the Operating Range Parameter Description Conditions Min Typ 7 Max Unit VDR VCC for Data Retention 1 0 V ICCDR Data Retention Current VCC 1 0V CE VCC 0 2V VIN VCC 0 2V or ...

Page 5: ...ns tHD Data Hold from Write End 0 0 ns tHZWE WE LOW to High Z 11 12 20 25 ns tLZWE WE HIGH to Low Z 11 10 10 ns Notes 9 BHE BLE is the AND of both BHE and BLE Chip can be deselected by either disabling the chip enable signal or by disabling both BHE and BLE 10 Test conditions for all parameters other than three state parameters assume signal transition time of 1V ns or less timing reference levels...

Page 6: ...s valid prior to or coincident with CE and BHE BLE transition LOW ADDRESS DATA OUT PREVIOUS DATA VALID DATA VALID tRC tAA tOHA Read Cycle 1 Address Transition Controlled 14 15 Read Cycle No 2 OE Controlled 15 16 50 50 DATA VALID tRC tACE tLZBE tLZCE tPU DATA OUT HIGH IMPEDANCE IMPEDANCE ICC ISB tHZOE tHZCE tPD OE CE HIGH VCC SUPPLY CURRENT tHZBE BHE BLE tLZOE ADDRESS tDBE tDOE Feedback ...

Page 7: ...9 During this period the I Os are in output state and input signals should not be applied Switching Waveforms continued tHD tSD tPWE tSA tHA tAW tWC DATA I O ADDRESS CE WE OE tHZOE DATAIN NOTE Write Cycle No 1 WE Controlled 13 17 18 19 BHE BLE tBW tSCE tHD tSD tPWE tHA tAW tSCE tWC tHZOE DATAIN CE ADDRESS WE DATA I O OE NOTE 19 Write Cycle No 2 CE Controlled BHE BLE tBW 13 17 18 tSA Feedback ...

Page 8: ...DATAIN tHD tSD tLZWE tPWE tSA tHA tAW tSCE tWC tHZWE CE ADDRESS WE DATAI O NOTE 19 Write Cycle No 3 WE Controlled OE LOW tBW BHE BLE 18 DATA I O ADDRESS tHD tSD tSA tHA tAW tWC CE WE DATAIN Write Cycle No 4 BHE BLE Controlled OE LOW 18 NOTE 19 tBW BHE BLE tSCE tPWE tHZWE tLZWE Feedback ...

Page 9: ...t Disabled Active ICC L L X L L Data In I OO I O15 Write Active ICC L L X H L Data In I OO I O7 I O8 I O15 in High Z Write Lower byte only Active ICC L L X L H Data In I O8 I O15 I O0 I O7 in High Z Write Higher byte only Active ICC Ordering Information Speed ns Ordering Code Package Name Package Type Operating Range 55 CY62147DV18L 55BVI BV48A 48 ball Fine Pitch BGA 6 mm 8mm 1 mm Industrial CY621...

Page 10: ... use as critical components in life support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user The inclusion of Cypress Semiconductor products in life support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges MoBL is a registered trademark an...

Page 11: ...pec from 2 20V to 2 25V Modified VIH spec on footnote 6 from VCC MAX 0 5V to VCC MAX 0 75V Changed ICC TYP values from 8 mA to 6 mA Changed ICC MAX values at Vcc max 1 95V from 15 mA to 12 mA L bin and 10 mA to 8mA LL bin Changed ICC MAX values at Vcc max 2 25V from 18 mA to 15 mA L bin and 12mA to 10 mA LL bin With modified Vcc MAX spec changed ISB1 and ISB2 MAX values from 15 uA to 18 uA L bin a...

Reviews: