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Examples of typical test setups for
METHOD A
and
METHOD B
are shown in Figure
17 for an EUT having a single power input port (and no other I/O ports) with one to
five power conductors, and no other input/output ports.
F
F
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i
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u
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1
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7
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Test setups for devices having multiple I/O ports are more complex, and usually
require multiple CDNs of different types. Refer to the IEC 61000-4-6 standard for
guidance.
When a CDN is employed as a CDN in the test setup, but is not connected to the
Test Generator equipment, a 50 ohm terminator must be connected to its RF port.
A CDN can also be employed in the test setup as a Decoupling Networks (DN), as
described in IEC 61000-4-6, by leaving its RF port open (no connection).
The test is typically performed starting from the lowest test frequency up to the
highest test frequency, one test frequency at a time, with a one to three second
dwell time at each test frequency, depending on the reaction time of the EUT.
The RF carrier is usually 80% amplitude modulated with a 1 kHz sine wave.
Refer to the applicable IEC 61000-4-6 and/or relevant product family or product
environment standard(s) to ensure the proper application of the test.
