6
3
‐
12.
Tes
3
‐
13.
The
following
p
setup
equi
be
substitu
losses
to
th
sensitivity,
3
‐
14.
Em
3
‐
15.
Stim
structures
radiates
fro
frequency
st
Setups
e
Cokeva
1194
paragraphs
des
pment
used
in
uted
for
the
re
he
signal
levels
,
subtract
its
ga
The
diele
voltage
o
user,
the
issions
Test
Se
mulus
Respons
can
be
tested
om
an
antenna
and
relative
am
0C
operates
as
scribe
differen
n
these
exampl
commended
e
s
indicated
on
ain
from
the
di
ectric
material
of
1
kV.
To
prev
probe
should
etup
:
Figure
4
i
se
Test
Setup
:
T
using
stimulus
a
placed
inside
mplitude
infor
s
either
a
local
t
applications
les.
Any
equipm
equipment.
Wh
the
spectrum
a
isplayed
signal
on
the
tip
of
t
vent
damage
t
not
be
used
w
llustrates
the
b
Figure
4.
Em
The
relative
sh
s
response
tech
e
the
enclosure
rmation.
See
Se
C
ized
magnetic
and
test
setup
ment
that
satis
hen
used
as
a
p
analyzer.
If
a
p
level.
the
probe
has
to
the
probe
a
where
a
potent
basic
configura
missions
Test
hielding
effectiv
hniques.
See
F
e
under
test,
w
ection
3
‐
17
for
Cokeva
1
field
probe
or
ps
for
the
probe
sfies
the
critica
probe,
be
sure
preamplifier
is
a
characterist
and/or
persona
tial
of
over
1
k
ation
used
for
d
Setup
veness
of
vario
igure
5.
The
tr
while
the
probe
r
proper
probe
1940C
O
localized
mag
e.
Table
3
lists
al
specification
to
add
the
ant
used
to
increa
ic
breakdown
al
injury
to
the
kV
is
available.
detecting
EMl
ous
enclosures
acking
generat
e
and
spectrum
placement.
Operation
netic
field
sour
the
recommen
s
listed
in
Tabl
tenna
‐
factors
a
se
measureme
e
.
emissions.
s
and
shielded
tor
output
sign
m
analyzer
prov
n Note
rce.
The
nded
test
le
3
may
and
cable
ent
nal
vide
