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AU9368 USB Multi-LUN Flash Card Reader Controller V1.19W
Official Release_ Public
7.5 Crystal Oscillator Circuit Setup for
Characterization
The following setup was used to measure the open loop voltage gain for crystal
oscillator circuits. The feedback resistor serves to bias the circuit at its quiescent
operating point and the AC coupling capacitor, Cs, is much larger than C1 and C2.
Figure 7.2 Crystal Oscillator Circuit Setup for Characterization
7.6 ESD Test Results
Test Description: ESD Testing was performed on a Zapmaster system using the
Human-Body-Model (HBM) and Machine-Model (MM), according to MIL-STD 883 and
EIAJ IC-121 respectively.
Human-Body-Model stresses devices by sudden application of a high voltage
supplied by a 100pF capacitor through 1.5k-ohm resistance.
Machine-Model stresses devices by sudden application of a high voltage
supplied by a 200pF capacitor through very low (0 ohm) resistance.
Test circuit & condition
Zap Interval: 1 second
Number of Zaps: 3 positive and 3 negative at room temperature
Criteria: I-V Curve Tracing
Table 7.5 ESD Data
Model
Mode
S/S
Target
Results
HBM
Vdd, Vss, I/C
15
6000V
PASS
MM
Vdd, Vss, I/C
15
200V
PASS
