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OPERATION
Axio Examiner
Illumination and contrast procedures
Carl Zeiss
M60-2-0003 e 05/2012
59
(3) Setting of a transmitted-light bright field
according to KÖHLER
−
The Axio Examiner has been put into
operation properly (see chapter 3).
−
The transmitted-light illumination is switched
on at the external power supply unit
1
).
•
Set image brightness using the light intensity
controller (Figure 4-1/
2
) at the external power
supply unit.
•
Place a high-contrast specimen in the universal
mounting frame on the mechanical stage.
•
Swing the front lens at the condenser in
position (for objectives
≥
10x), and set the
condenser to the upper stop using the pinion
knob for height adjustment (Figure 4-2/
2
). The
stop must be set to ensure that the specimen
will not be lifted out of position by the
condenser.
•
Switch the revolving disk of the condenser
(where existing) using the knurled ring
(Figure 4-2/
4
) to the
H
position for the bright
field.
•
Swing the 10x objective in position at the
objective mount or objective nosepiece
(Figure 4-2/
7
), and focus on the specimen using
the pinion knob (Figure 4-2/
3
).
•
Close the luminous-field diaphragm
(Figure 4-2/
5
) until the luminous-field
diaphragm also becomes visible in the visual
field (even if out of focus) (Figure 4-2/
A
).
•
Lower the condenser using the pinion knob for
height adjustment until the bright field stop rim
appears sufficiently in focus (Figure 4-2/
B
).
•
Center the luminous-field diaphragm using
both centering screws (Figure 4-2/
1
) at the
condenser carrier (Figure 4-2/
C
), and then open
it until the stop rim just disappears from the
visual field (Figure 4-2/
D
).
Figure 4-1 HAL 100 external power supply unit
Figure 4-2 Microscope settings on the Axio
Examiner in the transmitted-light
bright field
Содержание Axio Examiner
Страница 1: ...Operating Manual Axio Examiner Research Microscope...
Страница 13: ...INTRODUCTION Axio Examiner List of interfaces Carl Zeiss M60 2 0003 e 05 2012 13 Figure 1 2 List of interfaces...
Страница 19: ...EQUIPMENT DESCRIPTION Axio Examiner System overview Carl Zeiss M60 2 0003 e 05 2012 19 2 2 System overview...
Страница 20: ...EQUIPMENT DESCRIPTION Carl Zeiss System overview Axio Examiner 20 M60 2 0003 e 05 2012...
Страница 21: ...EQUIPMENT DESCRIPTION Axio Examiner System overview Carl Zeiss M60 2 0003 e 05 2012 21...
Страница 22: ...EQUIPMENT DESCRIPTION Carl Zeiss System overview Axio Examiner 22 M60 2 0003 e 05 2012...
Страница 96: ......