Virtex-4 LX/SX Prototype Platform
19
UG078 (v1.2) May 24, 2006
Detailed Description
R
12. DUT Socket
The DUT socket contains the user FPGA, referred to as the
device under test
(DUT). The
DUT must be oriented using the P1 indicator on the board.
Caution!
Failure to insert the device to the proper orientation can damage the device. To avoid
pin damage, always use the vacuum tool provided when inserting or removing the Virtex-4
device. When using BGA packages, do not apply pressure to the device while activating the
socket. Doing so can damage the socket and/or the device.
13. Pin Breakout
The pin breakout area is used to monitor or apply signals to each of the DUT pins. Headers
can be soldered to the breakout area to use with certain types of oscilloscope probes, for
either connecting function generators or wiring pins to the pin breakout area. Clocks in the
pin breakout area that connect to the DUT clock pads are shown in
and
Table 8:
Breakout Clock Pin Connections for SF363 and FF668
SF363
FF668
Label
Clock Name
Pin
Number
Clock Name
Pin
Number
Bre
akou
t Area
IO_L4P_GC_LC_3
B10
IO_L4P_GC_LC_3
B13
IO_L4N_GC_VREF_LC_3
C10
IO_L4N_GC_VREF_LC_3
B12
IO_L5P_GC_LC_3
B13
IO_L5P_GC_LC_3
A16
IO_L5N_GC_LC_3
A13
IO_L5N_GC_LC_3
A15
IO_L6P_GC_LC_3
A8
IO_L6P_GC_LC_3
A10
IO_L6N_GC_LC_3
B8
IO_L6N_GC_LC_3
B10
IO_L7P_GC_LC_3
B14
IO_L7P_GC_LC_3
B17
IO_L7N_GC_LC_3
A14
IO_L7N_GC_LC_3
A17
IO_L3P_GC_LC_3
C11
IO_L3P_GC_LC_3
C14
IO_L3N_GC_LC_3
B11
IO_L3N_GC_LC_3
C15
IO_L4P_GC_LC_4
Y6
IO_L4P_GC_LC_4
AF11
IO_L4N_GC_VREF_LC_4
W6
IO_L4N_GC_VREF_LC_4
AF10
IO_L5P_GC_LC_4
W11
IO_L5P_GC_LC_4
AE14
IO_L5N_GC_LC_4
W10
IO_L5N_GC_LC_4
AE13
IO_L6P_GC_LC_4
Y7
IO_L6P_GC_LC_4
AE10
IO_L6N_GC_LC_4
W7
IO_L6N_GC_LC_4
AD10
IO_L7P_GC_VRN_LC_4
Y10
IO_L7P_GC_VRN_LC_4
AD17
IO_L7N_GC_VRP_LC_4
Y9
IO_L7N_GC_VRP_LC_4
AD16
IO_L3P_GC_CC_LC_4
Y12
IO_L3P_GC_CC_LC_4
AB17
IO_L3N_GC_CC_LC_4
Y11
IO_L3N_GC_CC_LC_4
AC17