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Device Description
WAGO-I/O-SYSTEM 750
750-666/000-003 4FDI/2FDO 24V/10A PROFIsafe V2 iPar
Manual
Version 1.2.0, valid from HW/SW Version 01/01
4.6.8.2
Single-channel Safety Application, Proof Test Interval 10 Years
Table 19: Safety parameters for single-channel safety application
Maximum Safety integrity Level
acc. EN 62061
SIL2
Maximum safety integrity level
acc. IEC 61508
SIL2
Maximum performance level
acc. EN ISO 13849-1
Cat. 2/PL d
Proof test interval
10 years
Probability of failure PFD,
Proof test interval 10 years,
(low demand mode) (IEC 61508)
for one input
(input to fieldbus)
for one single-channel output
(fieldbus to output)
for four inputs and two
single-channel outputs (intputs to
fieldbus and fieldbus to outputs)
6.51 * 10-5 (0.65% of all
PFD from 10-2 at SIL2)
9.80 * 10-5 (0.98% of all
PFD from 10-2 at SIL2)
1.42 * 10-4 (1.42% of all
PFD from 10-2 at SIL2)
Probability of failure PFH,
Proof test interval 10 years,
(low demand mode) (IEC 61508)
for one input
(input to fieldbus)
for one single-channel output
(fieldbus to output)
for four inputs and two
single-channel outputs (intputs to
fieldbus and fieldbus to outputs)
1.49 * 10-9 (0.15% of all
PFH from 10-6 at SIL2)
2.24 * 10-9 (0.23 % of all
PFH from 10-6 at SIL2)
3.24 * 10-9 (0.32% of all
PFH from 10-6 at SIL2)
Hardware fault tolerance HFT with
single-channel application
(IEC 61508/EN ISO 13849-1)
0 (one error in the application can lead
to a failure of the safety
equipment)
DC (diagnostic coverage level)
94%
MTTF
d
(Mean Time To Failure dangerous)
331 years