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SLOS758G – DECEMBER 2011 – REVISED MARCH 2020
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Detailed Description
Copyright © 2011–2020, Texas Instruments Incorporated
6.14.1.4 Test Registers
6.14.1.4.1 Test Register (0x1A)
describes the bit fields of the Test register at 0x1A.
Default Value:
0x00, set at POR = H and EN = L
Table 6-35. Test Register (0x1A) (for Test or Direct Use)
BIT NO.
BIT NAME
FUNCTION
DESCRIPTION
B7
OOK_Subc_In
Subcarrier input
OOK pin becomes decoder digital input
B6
MOD_Subc_Out
Subcarrier output
MOD pin becomes receiver subcarrier output
B5
MOD_Direct
Direct TX modulation and RX reset
MOD pin becomes receiver subcarrier output
B4
o_sel
First stage output selection
0 = First stage output used for analog out and
digitizing
1 = Second stage output used for analog out and
digitizing
B3
low2
Second stage gain –6 dB, HP corner frequency / 2
B2
low1
First stage gain –6 dB, HP corner frequency / 2
B1
zun
Input followers test
B0
Test_AGC
AGC test, AGC level is seen on rssi_210 bits
6.14.1.4.2 Test Register (0x1B)
describes the bit fields of the Test register at 0x1B. When a test_dec or test_io is set, the IC is
switched to test mode. Test mode persists until a stop condition arrives. At stop condition, the test_dec
and test_io bits are cleared.
Default Value:
0x00, set at POR = H and EN = L
Table 6-36. Test Register 2 (0x1B) (for Test or Direct Use)
BIT NO.
BIT NAME
FUNCTION
DESCRIPTION
B7
test_rf_level
RF level test
B6
B5
B4
B3
test_io1
I/O test
Not implemented
B2
test_io0
B1
test_dec
Decoder test mode
B0
clock_su
Coder clock 13.56 MHz
For faster test of coders