Test Setup
4
SLVUBL1A – November 2018 – Revised February 2019
Copyright © 2018–2019, Texas Instruments Incorporated
TPS25831-Q1 Evaluation Module
Table 4. Test Points
Test Point
Label
Description
TP1
VCONN
VCC pin test point via R1 or external Vconn input
TP2
CSP
Test point of voltage between inductor and sense resistor.
TP3
CSN/OUT
CSN pin test point and DC-DC output test point
TP4
VIN
VIN pin test point
TP5
EN
EN pin test point or external EN input.
TP6,TP7, TP8, TP9
GND
Power ground test point
TP10
THERM_WARN
Thermal warning pin test point
TP11
CC1
CC1 pin test point
TP12
CC2
CC2 pin test point
TP13
LD
LD_DET pin test point
TP14
POL
POL pin test point
TP15
FLT
FAULT pin test point
TP16
VBUS
USB Type-A and USB Type-C connector, VBUS test point
TP17
RT
RT pin test point or external clock input.
2.2
Adjusting the Switching Frequency
If other frequencies are desired, within the frequency range of 400 kHz to 2.2 MHz, the R
t
resistor (R11)
value can be changed. Consult the data sheet for proper selection of the R
t
resistor (R11). Change the
inductor (L1) and the total output capacitance for proper control loop operation.
The RT/SYNC pin can also be used to synchronize the internal oscillator to an external clock. The
TPS25831EVMQ1-062 allows users to synchronize the internal oscillator to both Lo-Z clock source and
Hi-Z clock source by configuring R11, R12, and C13. Refer to the data sheet for detailed information.
2.3
Adjusting the Current Limit Value
If other current limit values are desired, the R
l
resistor (R15) value can be changed. Consult the data
sheet for proper selection of the R
l
resistor (R15).
2.4
Adjusting the Cable Compensation Value
If other cable compensation values are desired, the R
m
resistor (R16) value can be changed. Consult the
data sheet for proper selection of the R
m
resistor (R16).
2.5
Adjusting Thermal Management
If other thermal management desired, the R
T1
resistor, R14, R18 and R19 value can be changed. Consult
the data sheet for proper selection .