Setup
3.1.1
IEC 61000-4-2 Test Method and Set-Up
An example test setup is shown in
. Details of the testing table and ground planes can be found in
the IEC 61000-4-2 test procedure. Ground the EVM using the banana connector labeled GND (J6).
Discharge the ESD simulator on any of the Test Points TP1 – TP6. Contact and air-gap discharge are
tested using the same simulator with the same discharge waveform. While the simulator is in direct
contact with the test point during contact, it is not during air-gap.
Figure 2. System Level ESD Test Setup
3.1.1.1
Evaluation of Test Results
Connect the tested device on the EVM to a curve tracer both before and after ESD testing. After each
incremental level, if the IV curve of the ESD protection diode shifts ±0.1V, or leakage current increases by
a factor of ten, then the device is permanently damaged by ESD.
ESD Clamping Waveforms
A TPD6F002-Q1 (U1) also has an SMB (J5) connector for capturing clamping waveforms with an
oscilloscope during an ESD strike. Caution must be taken when capturing clamping waveforms during an
ESD event so as not to damage the oscilloscope.
3
SLVUAC7 – December 2014
TPD6F002-Q1EVM
Copyright © 2014, Texas Instruments Incorporated
