Texas Instruments TPD2E1B06DRLEVM, Руководство пользователя, Страница: 3 / 12

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SETUP
3.2 U2
TPD2E1B06DRL (U2) is configured with 4 SMA (J1 – J4) connectors to allow 4-port analysis with a vector
network analyzer. Connect Port 1 to J1, Port 2 to J2, Port 3 to J3, and Port 4 to J4. This configuration
allows for the following terminology in 4 port analysis:
• S
11
: Return loss
• S
21
: Insertion loss
• S
31
: Near end cross talk
• S
41
: Far end cross talk
3.3 U3 – U7
TPD2E1B06DRL (U3 – U7) can be used for destructive electrostatic discharge (ESD) pass/fail ESD
strikes. Specifically, they can be used for both IEC-61000-4-2 air and contact discharge tests. The
following procedure ensures proper testing setup and method for both discharge tests. Each IO has a Test
Pad (TP1 – TP10) directly connected to it.
3.3.1 Test Method and Set-Up
An example test setup is shown in Figure 2 . Details of the testing table and ground planes can be found in
the IEC 61000-4-2 test procedure. Ground the EVM using the banana connector labeled GND (J9).
Discharge the ESD simulator on any of the Test Points TP1 – TP10. Contact and air-gap discharge are
tested using the same simulator with the same discharge waveform. While the simulator is in direct
contact with the test point during contact, it is not during air-gap.
Figure 2. System Level ESD Test Setup
3 SLVU917 – August 2013 TPD2E1B06DRLEVM
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