Texas Instruments TPD E05U06-Q1 Series Скачать руководство пользователя страница 3

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Setup

3

SLVUAT8 – July 2016

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TPD1E05U06-Q1 Evaluation Module

Figure 1. Ideal Contact Discharge Waveform of the Output Current of the ESD Simulator at 8-kV

3

Setup

This section describes the intended use of the EVM. A generalized outline of the procedure given in IEC
61000-4-2 is described here. IEC 61000-4-2 should be referred to for a more specific testing outline. Basic
configurations for collecting s-parameters and ESD clamping waveforms are outlined as well.

3.1

IEC 61000-4-2 ESD Rating Tests

The TPD1E05U06-Q1DPY (D1 – D5) can be used for destructive electrostatic discharge (ESD) pass or
fail ESD strikes. Specifically, they can be used for both IEC 61000-4-2 air and contact discharge tests.
The following procedure ensures proper testing setup and method for both discharge tests. Each IO has a
Test Pad (TP1 – TP5) directly connected to it for striking ESD.

3.1.1

Test Method and Set-Up

An example test setup is shown in

Figure 2

Details of the testing table and ground planes can be found in

the IEC 61000-4-2 test procedure. Ground the EVM using the banana connector J3. Discharge the ESD
simulator on any of the test points TP1 – TP5. Contact and air-gap discharge are tested using the same
simulator with the same discharge waveform. While the simulator is in direct contact with the test point
during contact, it is not during air-gap.

Содержание TPD E05U06-Q1 Series

Страница 1: ...analysis This user s guide includes setup instructions schematic diagrams a bill of materials and printed circuit board layout drawings for the evaluation module Contents 1 Introduction 2 2 Definition...

Страница 2: ...s during an ESD event so as not to damage the oscilloscope A proper procedure is outlined in Section 3 3 1 2 Definitions Contact Discharge a method of testing in which the electrode of the ESD simulat...

Страница 3: ...0 4 2 ESD Rating Tests The TPD1E05U06 Q1DPY D1 D5 can be used for destructive electrostatic discharge ESD pass or fail ESD strikes Specifically they can be used for both IEC 61000 4 2 air and contact...

Страница 4: ...D protection diode shifts 0 1 V or leakage current increases by a factor of ten then the device is permanently damaged by ESD 3 2 Scattering Parameters A TPD1E05U06 Q1 D6 is configured with 2 SMA J1 a...

Страница 5: ...the oscilloscope attenuation of the measured signal is required Here is a procedure for testing D3 1 Ground the EVM using the banana connector J3 2 Attach two 10X attenuators in series to the oscillos...

Страница 6: ...05U06 Q1 Evaluation Module 4 Board Layout This section provides the TPD1E05U06 Q1EVM board layout The TPD1E05U06 Q1EVM is a 4 layer board of FR408HR at 0 062 inch thickness Layers 2 3 and 4 are ground...

Страница 7: ...l of Materials Table 3 Bill of Materials Count RefDes Description Package Reference Part Number MFR 6 D1 D2 D3 D4 D5 D6 1 Channel ESD Protection Device 0 42 pF DPY0002A DPY0002A TPD1E05U06QDPYRQ1 Texa...

Страница 8: ...ing the warranty period to the address designated by TI and that are determined by TI not to conform to such warranty If TI elects to repair or replace such EVM TI shall have a reasonable time to repa...

Страница 9: ...transmitter has been approved by Industry Canada to operate with the antenna types listed in the user guide with the maximum permissible gain and required antenna impedance for each antenna type indic...

Страница 10: ...ified allowable ranges some circuit components may have elevated case temperatures These components include but are not limited to linear regulators switching transistors pass transistors current sens...

Страница 11: ...REMOVAL OR REINSTALLATION ANCILLARY COSTS TO THE PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES RETESTING OUTSIDE COMPUTER TIME LABOR COSTS LOSS OF GOODWILL LOSS OF PROFITS LOSS OF SAVINGS LOSS OF USE L...

Страница 12: ...sponsible for compliance with all legal regulatory and safety related requirements concerning its products and any use of TI components in its applications notwithstanding any applications related inf...

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