Control and Status Registers
398
SPNU563A – March 2018
Copyright © 2018, Texas Instruments Incorporated
Level 2 RAM (L2RAMW) Module
8.3.3 L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
The DIAG_DATA_VECTOR_H register, shown in
and described in
, is used in
conjunction with the RAMTEST register to perform diagnostic tests.
Figure 8-4. L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
(offset = 24h)
31
0
DIAGNOSTIC_VECTOR[63:32]
R/WP-0
LEGEND: R/W = Read/Write; WP = Write in privilege mode only; -
n
= value after reset
Table 8-5. L2RAMW Diagnostic Data Vector High Register (DIAG_DATA_VECTOR_H)
Field Descriptions
Bit
Field
Description
31-0
DIAGNOSTIC_VECTOR
Used in conjunction with DIAG_DATA_VECTOR_L to form a 64-bit test vector used for
diagnostic test of two SECDEDs (read and write) and compare logic of the two SECDED
malfunctions and merged mux. This register is the upper 32 bits. This register is used in
conjunction with the RAMTEST register to perform diagnostic tests. See
for
details on how to start a diagnostic test.
8.3.4 L2RAMW Diagnostic Data Vector Low Register (DIAG_DATA_VECTOR_L)
The DIAG_DATA_VECTOR_L, shown in
and described in
, is used in conjunction
with the RAMTEST register to perform diagnostic tests.
Figure 8-5. L2RAMW Diagnostic Vector Low Register (DIAG_DATA_VECTOR_L)
(offset = 28h)
31
0
DIAGNOSTIC_VECTOR[31:0]
R/WP-0
LEGEND: R/W = Read/Write; WP = Write in privilege mode only; -
n
= value after reset
Table 8-6. L2RAMW Diagnostic Vector Low Register (DIAG_DATA_VECTOR_L)
Field Descriptions
Bit
Field
Description
31-0
DIAGNOSTIC_VECTOR
Used in conjunction with DIAG_DATA_VECTOR_H to form a 64-bit test vector used for
diagnostic test of two SECDEDs (read and write) and compare logic of the two SECDED
malfunctions and merged mux. This register is the lower 32 bits. This register is used in
conjunction with the RAMTEST register to perform diagnostic tests. See
for
details on how to start a diagnostic test.