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TMP392
VDD
SETA
SETB
OUTA
OUTB
GND
VCC
R
SETA
R
SETB
R
pullup
0.1 µF
Power Input
USB
LDO
Dual Buffer
Driver
Trip/Hysteresis
Settings
LED
OUTA
LED
OUTB
R
pullup
VCC
Trip Test
Switches
J1
Overview
5
SNIU040 – November 2019
Copyright © 2019, Texas Instruments Incorporated
TMP392EVM User's Guide
2.1
TMP392EVM Kit Contents
summarizes the contents of the TMP392EVM kit.
shows all of the included hardware.
Table 1. TMP392EVM Kit Contents
Item
Quantity
PCB Test Board: TMP392EVM
1
USB Cable Extender
1
3
EVM Hardware Overview and Operation
The TMP392EVM block diagram is shown in
, and each block is described in detail in the
following sections.
Figure 4. TMP392 Evaluation Board Block Diagram
3.1
Power Input and Regulation
Power is supplied from the USB connector, J2, with +5 V. This input can connect to the USB port of a
laptop or desktop. The evaluation board does not require an external power supply, but one may be used
if desired (such as when the breakout board is disconnected), so long as the voltage is within the
maximum rated voltage of the TMP392.
USB power is used when J1 is shorted at pins 1-2 using a jumper. This co5 V to the LDO (low
dropout regulator), providing a regulated output voltage of +3.3 V. If an external supply is required, then
jumper J1 can be removed and power may be connected to pin 2 of J1. If an external supply is used, the
input voltage can be from +2.2 V to +5.5 V. The input voltage can be measured at test pin TP1 (VDD).
The LED, D2, will illuminate when power is good.
3.2
Perforated Breakout Board
The EVM board is perforated along the unpopulated J3 designator to break away the sensor portion of the
board from the power and LED output for additional prototyping and testing. J3 provides connections for
the breakout board for power, inputs, and outputs. The pins located on both sides of the J3 designator are
labeled with silkscreen on the EVM, including SETA, SETB, OUTA, OUTB, VDD, and GND. All
components on the breakout board are rated up to +150°C. The EVM was not designed with high-
temperature PCB material, and thus was not designed for prolonged testing at high temperature.