4.3.1.4
Test Data Output (TDO)
The
TDO
pin provides an output stream of serial information from the IR chain or the DR chains.
The value of
TDO
depends on the current TAP state, the current instruction, and the data in the
chain being accessed. In order to save power when the JTAG port is not being used, the
TDO
pin
is placed in an inactive drive state when not actively shifting out data. Because
TDO
can be connected
to the
TDI
of another controller in a daisy-chain configuration, the
IEEE Standard 1149.1
expects
the value on
TDO
to change on the falling edge of
TCK
.
By default, the internal pull-up resistor on the
TDO
pin is enabled after reset, assuring that the pin
remains at a constant logic level when the JTAG port is not being used. The internal pull-up and
pull-down resistors can be turned off to save internal power if a High-Z output value is acceptable
during certain TAP controller states (see page 776 and page 778).
Note:
If the device fails initialization during reset, the hardware toggles the
TDO
output as an
indication of failure. Thus, during board layout, designers should not designate the
TDO
pin
as a GPIO in sensitive applications where the possibility of toggling could affect the design.
4.3.2
JTAG TAP Controller
The JTAG TAP controller state machine is shown in Figure 4-2. The TAP controller state machine
is reset to the Test-Logic-Reset state on the assertion of a Power-On-Reset (POR). In order to reset
the JTAG module after the microcontroller has been powered on, the
TMS
input must be held HIGH
for five TCK clock cycles, resetting the TAP controller and all associated JTAG chains. Asserting
the correct sequence on the
TMS
pin allows the JTAG module to shift in new instructions, shift in
data, or idle during extended testing sequences. For detailed information on the function of the TAP
controller and the operations that occur in each state, please refer to
IEEE Standard 1149.1
.
211
June 18, 2014
Texas Instruments-Production Data
Tiva
™
TM4C1294NCPDT Microcontroller